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Frontiers in Electronic Testing : Process-Aware SRAM Design and Test - Andrei Pavlov

Frontiers in Electronic Testing

Process-Aware SRAM Design and Test

By: Andrei Pavlov, Manoj Sachdev

Hardcover | 21 June 2008

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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies.

Other Editions and Formats

Paperback

Published: 28th October 2010

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