Results for author 'Manoj Sachdev'

Esd Protection Device and Circuit Design for Advanced CMOS Technologies

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Frontiers in Electronic Testing

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

Process-Aware SRAM Design and Test

ESD Protection Device and Circuit Design for Advanced CMOS Technologies

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

Process-Aware SRAM Design and Test