Electron and Ion Microscopy and Microanalysis : Principles and Applications, Second Edition, - Lawrence E Murr

Electron and Ion Microscopy and Microanalysis

Principles and Applications, Second Edition,

By: Lawrence E Murr (Editor)

Hardcover | 25 July 1991 | Edition Number 2

At a Glance

Hardcover


$1,168.25

or 4 interest-free payments of $292.06 with

 or 

Aims to ship in 15 to 25 business days

The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr

More in Optical Physics

Introduction to Optical Metrology - Rajpal S. Sirohi
Progress in Optics : Progress in Optics - Taco  Visser
Optics of the Moon - Kaydash

RRP $263.95

$234.25

11%
OFF