Electron and Ion Microscopy and Microanalysis
Principles and Applications, Second Edition,
By: Lawrence E Murr (Editor)
Hardcover | 25 July 1991 | Edition Number 2
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ISBN: 9780824785567
ISBN-10: 0824785568
Series: Optical Science and Engineering
Published: 25th July 1991
Format: Hardcover
Language: English
Number of Pages: 856
Audience: Professional and Scholarly
Publisher: MARCEL DEKKER INC
Country of Publication: GB
Edition Number: 2
Edition Type: New edition
Dimensions (cm): 25.4 x 17.8
Weight (kg): 1.6
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This product is categorised by
- Non-FictionEngineering & TechnologyTechnology in GeneralEngineering in General
- Non-FictionScienceScience in GeneralScientific EquipmentMicroscopy
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