General Considerations | p. 1 |
Introduction | p. 1 |
Introduction | p. 1 |
Meaning of the Word "Powder" | p. 3 |
Sample and Specimen | p. 3 |
Why Powder Diffraction? | p. 4 |
Difficulties and Limitations of Powder Diffraction | p. 5 |
Fundamentals of Diffraction | p. 5 |
Analysis of Powder Diffraction Patterns | p. 7 |
Powder Diffraction | p. 9 |
History of Powder Diffraction | p. 9 |
Programs for the Analysis of Powder Diffraction Data | p. 11 |
Crystal Structures from Powder Diffraction Data | p. 13 |
Pattern Decomposition for Accurate Intensities | p. 15 |
Profile Shape Functions | p. 22 |
Early Ab Initio Crystal Structure Determinations from Powder Diffraction Data by Pattern Decomposition | p. 26 |
Ab Initio Structure Determination by Direct Methods in Powder Diffraction | p. 31 |
Crystal Structures Determined by Direct Methods | p. 34 |
Preferred Orientation in Powder Diffraction | p. 36 |
Line Broadening: Crystallite Size, Strain and Stress | p. 37 |
The Rietveld Method | p. 41 |
The Rietveld Method | p. 41 |
The Early Days of the Rietveld Method | p. 41 |
The Method | p. 44 |
Rietveld Refinement with X-Ray Powder Diffraction Data | p. 48 |
Critical Assessment of the Rietveld Method | p. 51 |
Guidelines for Rietveld Refinement | p. 56 |
Special Applications of the Rietveld Method | p. 64 |
Quantitative Phase Analysis by the Rietveld Method | p. 64 |
Texture Analysis Using the Rietveld Method | p. 70 |
The Two Stage Method | p. 73 |
Introduction and Background | p. 73 |
Concept of the Two Stage Method | p. 73 |
The Two Stage Method in Comparison to Rietveld Refinement | p. 76 |
Profile Analysis and Profile Fitting | p. 77 |
Characteristics of Powder Diffraction Line Profiles | p. 77 |
Outline of Profile Fitting | p. 78 |
Profile Functions | p. 79 |
The Instrument Function | p. 82 |
Instrument Function with Seven Lorentzians | p. 84 |
Determination of Integrated Intensities through Profile Fitting | p. 87 |
Angle Dependence of the Profile Shapes | p. 88 |
Resolution of Profile Fitting | p. 90 |
High Resolution Powder Diffraction - Lattice Parameters | p. 91 |
Examples of Profile Fitting in the Two Stage Method | p. 95 |
Examples for PROFAN | p. 95 |
Examples for HFIT | p. 98 |
POWLS | p. 99 |
Structure Refinement with POWLS | p. 99 |
The Program POWLS | p. 99 |
Preparation of a Model Structure | p. 103 |
Observations | p. 105 |
Refinement | p. 106 |
Preferred Orientation | p. 106 |
Specimen and Preferred Orientation | p. 107 |
Specimen Preparation | p. 107 |
Random Distribution | p. 108 |
Calculational Corrections | p. 109 |
Crystallite Size Effects | p. 110 |
R-Values | p. 112 |
General Remarks | p. 112 |
R-Values in Powder Diffraction | p. 113 |
Background | p. 114 |
Dealing with Background | p. 115 |
Background in Rietveld Programs | p. 115 |
The Profile R-Value | p. 119 |
The Weighted Profile R-Value | p. 120 |
The Bragg R-Value | p. 121 |
Conclusion | p. 125 |
Structure Refinement by the Two Stage Method | p. 125 |
Refinement with POWLS | p. 125 |
Examples Using the Two Stage Method and the Program POWLS | p. 128 |
Comparison of the Rietveld Method and the Two Stage Method | p. 128 |
Merits and Limitations of the Rietveld Method and the Two Stage Method | p. 134 |
Conclusion | p. 136 |
Analysis of Quartz | p. 136 |
Sample Preparation | p. 137 |
Experiments | p. 137 |
Sample Rotation during Experiments | p. 138 |
Crystal Structure Refinement with POWLS of [alpha]-Quartz Collected with Cu K[alpha] Radiation | p. 139 |
Refinement of [alpha]-Quartz Data Collected with Synchrotron X-Rays | p. 141 |
Texture Analysis with the Two Stage Method Using Neutron Diffraction | p. 147 |
Introduction | p. 147 |
The Position Sensitive Detector Julios | p. 149 |
Data Collection | p. 149 |
Data Evaluation | p. 151 |
Examples of Texture Analysis | p. 152 |
Selected Examples for the Application of the Two Stage Method | p. 160 |
Electron Density Distribution of an Olivine Sample by Fourier Methods | p. 160 |
Electron Density Distribution in CeO[subscript 2] | p. 164 |
Crystal Structure Analysis of Yb[subscript 2]O[subscript 3] | p. 167 |
Application in High Pressure Research | p. 172 |
Cation Distribution in a Thin Film Garnet Sample | p. 176 |
Structure Determination from Energy Dispersive Data | p. 181 |
Structure Determination from Energy Dispersive Data | p. 181 |
Synchrotron Radiation | p. 182 |
Neutron Diffraction by Time-of-Flight Measurements | p. 183 |
Simultaneous Angle and Position Resolving Neutron Diffraction by Time-of-Flight Measurements | p. 184 |
Electronic Zooming | p. 188 |
Analysis of TOF Data | p. 190 |
Laue Diffraction with Neutrons by Time-of-Flight Measurements | p. 193 |
Conclusion | p. 194 |
References | p. 195 |
An Example of POWLS for Quartz | p. 203 |
Index | p. 219 |
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