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Frequency Measurement and Control : Advanced Techniques and Future Trends - Andre N. Luiten

Frequency Measurement and Control

Advanced Techniques and Future Trends

By: Andre N. Luiten (Editor)

Paperback | 23 August 2014

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Optical frequency measurement is an extremely challenging field of experimental physics which is presently undergoing a renaissance driven by the needs of modern high density optical communication systems as well as by requirements of high-resolution laser spectroscopy. This text is the first to discuss the development of traditional and second generation frequency chains together with their enabling technology. Reviews written by some of the most experienced researchers in their respective fields address the technology of frequency metrology such as: low noise microwave oscillators and microwave frequency standards, low noise and high stability optical frequency sources, optical frequency standards, traditional and second-generation optical frequency measurement and synthesis techniques as well as optical frequency comb generators. It should prove useful to researchers just entering the field of frequency metrology or equally well to the experienced practitioner.
Industry Reviews

 "FREQUENCY MEASUREMENT AND CONTROL is a valuable compilation of recent research results in the 'continued quest to improve the performance of oscillators.'...The book does a very good job of covering all the relevant issues involved in frequency locking, starting from materials sciences (the basics of frequency references), all the way to control theory (frequency locking, measurements, and synthesis). The authors skillfully guide the reader by suggesting background reading material, reviewing important research results and anticipating future developments that could be triggered, for example, by advances in materials science. Overall, the book is very well written and well suited to its target audience. It is a clear and well-organized reference, with a wealth of information and pointers to information."

-- OPTICS & PHOTONICS NEWS

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