
Accelerated Testing
Statistical Models, Test Plans, and Data Analysis
By: Wayne B. Nelson
Paperback | 1 December 2007 | Edition Number 1
At a Glance
Paperback
RRP $310.15
$309.75
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ISBN: 9780471697367
ISBN-10: 0471697362
Series: Wiley Series in Probability and Statistics
Published: 1st December 2007
Format: Paperback
Language: English
Number of Pages: 624
Audience: Professional and Scholarly
Publisher: John Wiley & Sons Inc (US)
Country of Publication: US
Edition Number: 1
Edition Type: Revised
Dimensions (cm): 22.7 x 15.2 x 3.5
Weight (kg): 0.84
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- Non-FictionEngineering & TechnologyTechnology in GeneralEngineering in General
- Non-FictionMathematicsProbability & Statistics
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