| Introduction | p. 1 |
| Vortices in High-T[subscript c] Superconductors | p. 5 |
| Introduction | p. 5 |
| Basic Physics of Vortices | p. 7 |
| Type-II Superconductivity and Vortex | p. 7 |
| Vortex Lattice, Bragg Glass | p. 8 |
| Motion of a Vortex: Flux Flow and Flux Creep | p. 9 |
| Microscopic Electronic Structure of Vortex Core | p. 10 |
| Vortices in High-T[subscript c] Superconductors | p. 11 |
| Characteristic Aspects of the Mixed State of High-T[subscript c] Superconductors | p. 11 |
| Vortices in High-T[subscript c] Superconductors | p. 12 |
| Equilibrium Phase Diagram | p. 13 |
| Dynamic Phase Diagram of Driven Vortices | p. 15 |
| Electronic States of Vortex Cores of High-T[subscript c] Superconductor | p. 19 |
| Vortex Dynamics in HTSC Thin Film | p. 22 |
| Thermally Depinning Transition | p. 23 |
| Electric Field vs Current Density Characteristics | p. 26 |
| Scaling Laws of Pinning and Iso-therm Scaling of E-J | p. 28 |
| Geometric Effect | p. 33 |
| Summary | p. 33 |
| Vortices in High-T[subscript c] Grain Boundary Junction | p. 34 |
| Direct Flux Detection Method | p. 34 |
| Magnetic Flux From a Single Vortex in Slotted YBCO | p. 36 |
| Long-distance Vortex Motion in Wide Grain Boundary Junction | p. 38 |
| Suppression of Long-distance Vortex Motion in Grain Boundary Junctions | p. 40 |
| 1/f Behavior of the Flux Noise of Slotted Grain Boundary Junctions | p. 42 |
| Flux Noise of Directly Coupled SQUID Magnetometers | p. 44 |
| References | p. 45 |
| Observation of Vortices | p. 53 |
| Introduction | p. 53 |
| Observation of a Vortex Pattern and Movement by the High-resolution Bitter Method | p. 56 |
| Experimental Procedure | p. 56 |
| The Observation of a Static Vortex Distribution | p. 57 |
| The Observation of a Dynamic Vortex Behavior | p. 62 |
| Scanning SQUID Observation | p. 65 |
| SSM System and Observation Technique | p. 66 |
| Flux Expulsion in Narrow High-T[subscript c] Thin Film Patterns | p. 68 |
| Flux Trapping in High-T[subscript c] Thin Film Patterns with Moats | p. 70 |
| Flux Trapping in High-T[subscript c] Films with a Bicrystal Grain Boundary | p. 74 |
| Observation of Multilayered Electronic Devices | p. 76 |
| Summary | p. 77 |
| Magneto-Optical Imaging | p. 77 |
| Experimental Method | p. 78 |
| Studies of Flux Density Profiles and Critical States | p. 84 |
| Dynamic Observations of Magnetic Flux | p. 84 |
| Differential Magneto-Optical Technique | p. 85 |
| Real-Time Observations of Single Vortex | p. 88 |
| Summary | p. 88 |
| Terahertz Radiation Imaging | p. 89 |
| THz Radiation Imaging System | p. 90 |
| Vortex Penetration Due to Transport Supercurrent | p. 93 |
| Vortex Entry at Weak Magnetic Field | p. 94 |
| Vortex Penetration Due to a Strong Magnetic Field | p. 95 |
| Temperature Dependence of the Trapped-Vortex Behavior | p. 96 |
| Summary | p. 99 |
| References | p. 100 |
| New Aspect of Vortex in HTSC | p. 103 |
| Introduction | p. 103 |
| Electrostatics and Charge Distribution in the Vortex State of Type-II Superconductors | p. 104 |
| Electrostatics of the Vortices | p. 105 |
| Hall Anomaly and Vortex Charge | p. 112 |
| Summary | p. 116 |
| Vortices in Intrinsic Josephson Junctions | p. 116 |
| Basic Model for a Stack of Josephson Junctions | p. 118 |
| Basic Properties of Intrinsic Josephson Junctions | p. 120 |
| Properties of Vortices in Intrinsic Josephson Junctions | p. 122 |
| Behavior of Vortices in Stacks of Josephson Junctions | p. 125 |
| Summary | p. 126 |
| Optical Control of Vortices | p. 127 |
| Idea for Optical Vortex Generation | p. 127 |
| Experimental Setup | p. 130 |
| Optical Vortex Generation with Optical Pulses | p. 130 |
| Single Shot Pulse Operation | p. 133 |
| Summary | p. 135 |
| References | p. 136 |
| High-T[subscript c] SQUIDs | p. 141 |
| Introduction | p. 141 |
| HTSC Junctions for SQUIDs | p. 142 |
| Transport Properties | p. 142 |
| Noise Rounding and Excess Current | p. 145 |
| 1/f Noise | p. 146 |
| Dependence of SQUID Performance on Junction Parameters | p. 147 |
| SQUID Inductance | p. 150 |
| Pickup Coil and Coupling Circuit | p. 152 |
| Thermal Activation in the Flux Dam | p. 154 |
| Switch for Opening and Closing the Pickup Coil | p. 157 |
| SQUID Control System | p. 159 |
| Input Equivalent Noise | p. 159 |
| Bias-Reversal Schemes | p. 160 |
| Readout Electronics | p. 164 |
| Noise Reduction in HTSC-SQUIDs | p. 165 |
| Low Frequency Noises in HTSC-SQUIDs | p. 166 |
| Direct-Coupled Magnetometers | p. 166 |
| Effects of Slots and Holes on the Reduction of Low frequency Noise | p. 167 |
| Flux Penetration | p. 169 |
| Behaviors of Flux Dams | p. 171 |
| Development of SQUIDs for Microscopes | p. 177 |
| References | p. 182 |
| Applications of HTSC SQUIDs | p. 185 |
| Introduction | p. 185 |
| HTSC-SQUID for Commercial Use | p. 187 |
| SQUID Kit | p. 187 |
| Advanced SQUID Kit | p. 190 |
| Commercialization of SQUID | p. 193 |
| Challenge to Shield-Less HTSC-SQUID Magnetocardiography | p. 194 |
| Open-SQIUD Magnetocardiography Equipment | p. 195 |
| Adaptive Noise Canceling Process | p. 198 |
| Active Noise Control System for DC Fluctuations | p. 201 |
| Summary | p. 204 |
| Biological Immunoassays | p. 205 |
| Measurement Principle | p. 205 |
| Measurement System | p. 206 |
| Monitoring Environmental Magnetic Field Related to Earthquakes | p. 214 |
| ULF Variation as a Precursory Phenomenon of an Earthquake | p. 215 |
| Requiremente on the Measurement System of ULF Radiation | p. 216 |
| SQUID System for ULF Magnetic Field Measurement | p. 218 |
| Field Measurement | p. 220 |
| Future Problem | p. 224 |
| Laser-SQUID Microscope for LSI Chip Defect Analysis | p. 224 |
| The Laser-SQUID System | p. 225 |
| Prototype System Setup | p. 227 |
| Basic Demonstration Using 488 nm Laser | p. 227 |
| Backside Failure Identification before Bondpad Patterning | p. 228 |
| Defective Chip Identification after Bonding and Packaging | p. 230 |
| Localization from Whole Chip Area to Micrometer Area | p. 231 |
| Conclusions | p. 232 |
| Small-Scale HTSC Digital Applications | p. 233 |
| Sampler | p. 234 |
| Analog to Digital Converter | p. 240 |
| Summary | p. 244 |
| References | p. 244 |
| Material Technology for Vortex Electronics | p. 249 |
| Introduction | p. 249 |
| Pulsed Laser Deposition Method for HTSC and Related Oxide Film Formation | p. 250 |
| Eclipse PLD | p. 251 |
| Aurora PLD | p. 252 |
| Application of the Eclipse-Aurora PLD Method to Electronics Devices | p. 258 |
| Summary | p. 260 |
| MOCVD for Thin Film Growth | p. 260 |
| Atomic-Layer MOCVD System | p. 261 |
| Real-Time Process Monitoring | p. 262 |
| Ga Addition to YBCO Thin Films | p. 267 |
| Summary | p. 270 |
| Sputter Growth of HTSC Thin Films | p. 270 |
| Fundamental Features of Sputtering | p. 270 |
| Synthesis of High Quality Films and Large Sized Film Deposition | p. 271 |
| Epitaxial Growth of EuBa[subscript 2]Cu[subscript 3]O[subscript 7] Films on R-plane Sapphires | p. 273 |
| Application of Sputter Plasma to Recovery Treatment | p. 276 |
| Summary | p. 278 |
| Preparation of Ultrathin Films and Superlattices of high-T[subscript c] Oxides by MBE | p. 279 |
| MBE Growth of Oxide Thin Films | p. 280 |
| RHEED Oscillations | p. 280 |
| Superconductivity of Ultrathin YBCO Films | p. 282 |
| Superconducting Transition of Ultrathin Films and Superlattices in Magnetic Fields | p. 286 |
| Summary | p. 289 |
| References | p. 289 |
| Index | p. 293 |
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