Springer Surface Sciences

By: John O'Connor (Editor), Brett Sexton (Editor), Roger S.C. Smart (Editor)

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Hardcover | 23 April 2003 | Edition Number 2

At a Glance

Hardcover
616 Pages

Edition Type
Revised

Dimensions(cm)
23.5 x 15.88 x 2.16

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This guide to the use of surface analysis techniques, now in its second edition, has expanded to include more techniques, current applications and updated references. It outlines the application of surface analysis techniques to a broad range of studies in materials science and engineering. The book consists of three parts: an extensive introduction, a techniques section and a section on applications. Each chapter has been written by specialists in the field. This book is aimed at industrial scientists and engineers in R&D seeking a description of available techniques in a concise but informative style. It is invaluable as a comprehensive text for scientists and engineers attending training courses and workshops. The level and content of this book make it ideal as a course text for senior undergraduate and postgraduate students in materials science, materials engineering, physics, chemistry and metallurgy.

Industry Reviews

I teach graduate courses on Surface Analysis and on Surface Science (with a strong component of Surface Analysis). I was so impressed with the first edition of this book that I intended to adopt it for my class but, unfortunately, it was soon out-of-print. I encouraged John O'Connor to prepare another edition of this jewel that I could use in the future. What distinguishes this book from others is the very unusual breadth. It covers fundamentals, practical issues of analyses, and concrete applications to the analysis of metals, semiconductors, polymers, and ceramics (including minerals).

Quote from Prof. Raul Baragiola, University of Virginia

From the reviews of the second edition:

"More than 30 experts have contributed to this book providing a wealth of expertise based on theoretical as well as practical background. ... the book can be recommended not only to university students but also to scientists and engineers working in industry. It will help to find the appropriate method, or better the combination of methods, which will be needed to solve problems in process control and failure analysis." (W. Oesterle, Werkstoffe und Korrosion/Materials and Corrosion, Vol. 55 (3), 2004)

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You Can Find This Book In

Non-Fiction Engineering & Technology Mechanical Engineering & Materials Materials Science Technology in General Engineering in General Science Physics Chemistry Analytical Chemistry Spectrum Analysis

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Introduction
Solid Surfaces, Their Structure and Composition	p. 3
Importance of the Surface	p. 3
Solid Surfaces of Different Materials	p. 7
A Material Under Attack: Aluminium	p. 11
Methods of Surface Analysis	p. 12
Variety of Surface Analytical Techniques	p. 12
Structural Imaging	p. 13
Direct Physical Imaging	p. 13
Indirect Structural Imaging--Relaxation and Reconstruction	p. 20
Composition of the Surface Selvedge	p. 23
Electron Inelastic Mean Free Paths	p. 24
Variation of Elemental Sensitivities	p. 28
Practical Detection Limits	p. 31
Practical Spatial Limits	p. 32
Chemical State Information	p. 37
Laboratory Standards	p. 41
Inter-laboratory Errors	p. 41
Defect and Reaction Sites at Surfaces	p. 42
Electronic Structure at Surfaces	p. 46
Structures of Adsorbed Layers	p. 49
Structure in Depth Profiles Through Surfaces	p. 51
Specific Structures	p. 55
Grain Structures, Phase Distributions and Inclusions	p. 55
Fracture Faces and Intergranular Regions	p. 55
Pore Structures	p. 57
Precipitates, Reaction Products and Recrystallised Particles on Surfaces	p. 60
Magnetic Domains	p. 60
Technique-Induced Artifacts	p. 61
Radiation Damage	p. 61
Electrostatic Charging	p. 64
References	p. 65
UHV Basics	p. 71
The Need for Ultrahigh Vacuum	p. 71
Achieving UHV	p. 74
Specimen Handling	p. 76
Specimen Handling: ASTM Standards	p. 78
References	p. 81
Techniques
Electron Microscope Techniques for Surface Characterization	p. 85
What Do We Need to Know About Surface Structures?	p. 86
Electron Optical Imaging Systems	p. 87
Electron Sources	p. 89
Electron Lenses	p. 89
Detection Systems	p. 90
Scanning Electron Microscopy of Surfaces	p. 91
The SEM	p. 91
The Signals and Detectors	p. 92
Resolution and Contrast in SEM Images	p. 93
Variable Pressure SEM and Environmental SEM	p. 97
Energy Dispersive X-Ray Spectrometry	p. 98
Transmission Electron Microscopy of Surfaces	p. 99
The Transmission Electron Microscope	p. 99
Electron Diffraction	p. 101
Image Contrast and Resolution in the TEM	p. 101
Imaging Surface Structures in the TEM	p. 102
Reflection Electron Microscopy	p. 103
Other Developments	p. 103
References	p. 104
Sputter Depth Profiling	p. 107
Analysis of a Sputter Depth Profile	p. 108
Calibration of the Depth Scale	p. 108
Calibration of the Concentration Scale	p. 112
The Depth Resolution of Sputter Profiling	p. 115
Specification of the Depth Resolution	p. 115
Instrumental Factors Determining the Depth Resolution	p. 117
Surface Effects Determining the Depth Resolution	p. 119
Bulk Effects Affecting the Depth Resolution	p. 120
Minimisation of the Depth Resolution	p. 121
Conclusion	p. 123
References	p. 123
SIMS--Secondary Ion Mass Spectrometry	p. 127
The Practice of SIMS	p. 128
Overview	p. 128
Advantages and Disadvantages of SIMS	p. 130
The Yield of Secondary Ions	p. 131
Construction of a Secondary Ion Mass Spectrometer	p. 138
Topics in SIMS Analysis	p. 145
Signal Enhancement by Surface Adsorption	p. 145
Using Secondary Ion Energies in SIMS Analysis	p. 147
The Relative Sensitivity Factor	p. 149
Static SIMS Analysis	p. 150
References	p. 153
Auger Electron Spectroscopy and Microscopy--Techniques and Applications	p. 155
Introduction	p. 155
Fundamentals	p. 155
Instrumentation	p. 158
Quantification	p. 159
Techniques	p. 160
Spot Analysis Mode	p. 161
Line Scan Mode	p. 162
Scanning Mode	p. 163
Scanning Auger Microscopy	p. 164
Depth Profiling Mode	p. 167
Preferential Sputtering	p. 167
Attenuation Length	p. 168
Chemical Effects	p. 168
Applications	p. 169
Thin Film Analysis	p. 169
Surface Diffusion and Segregation	p. 170
Future	p. 171
References	p. 171
X-Ray Photoelectron Spectroscopy	p. 175
Basic Principles	p. 175
Theory	p. 175
Typical Spectrum	p. 176
Surface Specificity	p. 178
Instrumentation	p. 179
Essential Components	p. 179
Optional Components	p. 182
Synchrotron Radiation	p. 183
Imaging XPS	p. 183
Spectral Information	p. 184
Spin-Orbit Splitting	p. 184
Chemical Shifts	p. 185
Auger Chemical Shifts in XPS	p. 186
X-Ray Line Satellites	p. 187
"Shake-up" Lines	p. 187
Ghost Lines	p. 188
Plasmon Loss Lines	p. 189
Quantitative Analysis	p. 189
Experimental Techniques	p. 191
Variation of X-Ray Sources	p. 191
Depth Profiles	p. 191
Angular Variations	p. 194
Sample Charging	p. 194
Comparison with Other Techniques	p. 195
Applications	p. 197
Conclusion	p. 197
References	p. 198
Vibrational Spectroscopy of Surfaces	p. 203
Introduction	p. 203
Surface Techniques	p. 206
Diffuse Reflectance Infrared Fourier Transform (DRIFT)	p. 207
Attenuated Total Reflectance Spectroscopy (ATR)	p. 209
Photoacoustic Spectroscopy (PAS)	p. 216
Infrared Emission Spectroscopy (IES)	p. 219
Fourier transform Raman spectroscopy	p. 221
Raman Microscopy	p. 224
References	p. 227
Rutherford Backscattering Spectrometry and Nuclear Reaction Analysis	p. 229
Introduction	p. 229
Principles	p. 231
Stopping Power	p. 232
Straggling	p. 233
Rutherford Backscattering Spectrometry	p. 234
Experimental Considerations	p. 236
Examples	p. 236
Special Cases	p. 238
Nuclear Reaction Analysis	p. 240
Formalism	p. 241
Experimental Considerations	p. 242
Examples	p. 243
Summary	p. 245
References	p. 246
Materials Characterization by Scanned Probe Analysis	p. 247
Introduction	p. 247
The Surface Analytical Context	p. 251
Generic SPM Systems	p. 251
Physical Principles	p. 253
STM/STS	p. 253
Scanning Force Microscopy (SFM)	p. 256
Intermittent Contact Mode	p. 257
F-d Analysis	p. 258
Lateral Force Microscopy (LFM)	p. 260
Procedures for 'Best Practice'	p. 262
Spatial Characteristics of Scanners	p. 263
Determination of c[subscript N] and c[subscript T]	p. 264
Determination of Spring Constants	p. 265
Determination of Actual Tip Parameters in the Mesoscopic Regime	p. 266
Illustrative Case Studies	p. 267
Surface and Defect Structures of WTe[subscript 2] Investigated by UHV-STM	p. 267
Organic Thin Film and Surface Mechanical Characterization	p. 269
AFM Analysis of 'Soft' Biological Materials	p. 273
Nanotribology of Solid Lubricants	p. 278
References	p. 283
Low Energy Ion Scattering	p. 287
Qualitative Surface Analysis	p. 287
Advantage of Recoil Detection	p. 289
Quantitative Analysis	p. 291
Scattered Ion Yield	p. 291
Differential Scattering Cross Section	p. 291
Charge Exchange	p. 292
Relative Measurements	p. 295
Standards	p. 297
Surface Structural Analysis	p. 299
Multiple Scattering	p. 299
Impact Collision Ion Surface Scattering (ICISS)	p. 300
Experimental Apparatus	p. 302
References	p. 304
Reflection High Energy Electron Diffraction	p. 307
Theory	p. 309
Applications	p. 312
References	p. 318
Low Energy Electron Diffraction	p. 319
The Development of LEED	p. 319
The LEED Experiment	p. 320
Sample Preparation	p. 323
Data Collection	p. 323
Diffraction from a Surface	p. 324
Bragg Peaks in LEED Spectra	p. 325
LEED Intensity Analysis	p. 326
LEED Fine Structure	p. 328
Applications of LEED	p. 329
Determination of the Symmetry and Size of the Unit Mesh	p. 329
Unit Meshes for Chemisorbed Systems	p. 330
LEED Intensity Analysis	p. 330
Surface Barrier Analysis	p. 332
Conclusion	p. 333
References	p. 334
Ultraviolet Photoelectron Spectroscopy of Solids	p. 337
Experimental Considerations	p. 339
Angle Resolved UPS	p. 340
Fermi Surface Studies	p. 344
References	p. 345
EXAFS	p. 347
Introduction	p. 347
Experimental Details	p. 348
Synchrotron Radiation	p. 350
Synchrotron Beamlines for EXAFS	p. 352
Detectors	p. 354
The Sample	p. 355
Acquiring EXAFS Data	p. 357
Theory of X-ray Absorption	p. 359
EXAFS	p. 359
XANES	p. 361
EXAFS Analysis	p. 362
Data Reduction	p. 362
Conversion to k-space	p. 363
Background Subtraction	p. 363
Fourier Transformation	p. 364
Fourier Filtering and Back Transformation	p. 364
Modelling and Least Squares Fitting to the EXAFS Equation	p. 365
Case Studies	p. 366
Surface EXAFS of Titanium Nanostructure Thin Films	p. 366
Ion-Implantation Induced Amorphisation of Germanium	p. 370
References	p. 371
Table of Contents provided by Rittenhouse. All Rights Reserved.

Springer Surface Sciences

At a Glance

Hardcover

Industry Reviews

Shipping

How to return your order

Defective items

You Can Find This Book In

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