Springer Materials Science

Line Profile Analysis: A Historical Overview.- Convolution Based Profile Fitting.- Whole Powder Pattern Modelling: Theory and Applications.- Full Profile Analysis of X-ray Diffraction Patterns for Investigation of Nanocrystalline Systems.- Crystallite Size and Residual Strain/Stress Modeling in Rietveld Refinement.- The Quantitative Determination of the Crystalline and the Amorphous Content by the Rietveld Method: Application to Glass Ceramics With Different Absorption Coefficients.- Quantitative Analysis of Amorphous Fraction in the Study of the Microstructure of Semi-crystalline Materials.- A Bayesian/Maximum Entropy Method for the Certification of a Nanocrystallite-Size NIST Standard Reference Material.- Study of Submicrocrystalline Materials by Diffuse Scattering in Transmitted Wave.- Determining the Dislocation Contrast Factor for X-ray Line Profile Analysis.- X-ray Peak Broadening Due to Inhomogeneous Dislocation Distributions.- Determination of Non-uniform Dislocation Distributions in Polycrystalline Materials.- Powder Line Profiles Fitting in the Case of fcc Crystals with Stacking Faults.- Diffraction Elastic Constants and Stress Factors; Grain Interaction and Stress in Macroscopically Elastically Anisotaropic Solids; The Case of Thin Films.- Interaction Between Phases in Co-deforming Two-phase Materials: The Role of Dislocation Arrangements.- Grain Surface Relaxation Effects in Powder Diffraction.- Problems Related to X-ray Stress Analysis in Thin Films in Presence of Gradients and Texture.- Two-Dimensional XRD Profile Modelling in Imperfect Epitaxial Layers.- Three-Dimensional Reciprocal Space Mapping: Application to Polycrystalline CVD Diamond.