Springer Materials Science

By: Eric J. Mittemeijer (Editor), Paolo Scardi (Editor)

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Hardcover | 26 November 2003

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584 Pages

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23.5 x 15.88 x 3.81

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Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.

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You Can Find This Book In

Non-Fiction Engineering & Technology Technology in General Nanotechnology Mechanical Engineering & Materials Materials Science Science Physics Materials & States of Matter Chemistry Crystallography Electronics & Communications Engineering

Electronics Engineering Engineering in General

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Paperback

Published: 15th December 2010

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Line Profile Analysis: A Historical Overview	p. 3
Convolution Based Profile Fitting	p. 17
Whole Powder Pattern Modelling: Theory and Applications	p. 51
Full Profile Analysis of X-ray Diffraction Patterns for Investigation of Nanocrystalline Systems	p. 93
Crystallite Size and Residual Strain/Stress Modeling in Rietveld Refinement	p. 125
The Quantitative Determination of the Crystalline and the Amorphous Content by the Rietveld Method: Application to Glass Ceramics with Different Absorption Coefficients	p. 147
Quantitative Analysis of Amorphous Fraction in the Study of the Microstructure of Semi-crystalline Materials	p. 167
A Bayesian/Maximum Entropy Method for the Certification of a Nanocrystallite-Size NIST Standard Reference Material	p. 187
Study of Submicrocrystalline Materials by Diffuse Scattering in Transmitted Wave	p. 229
Determining the Dislocation Contrast Factor for X-ray Line Profile Analysis	p. 249
X-ray Peak Broadening Due to Inhomogeneous Dislocation Distributions	p. 287
Determination of Non-uniform Dislocation Distributions in Polycrystalline Materials	p. 309
Line Profile Fitting: The Case of fcc Crystals Containing Stacking Faults	p. 333
Diffraction Elastic Constants and Stress Factors; Grain Interaction and Stress in Macroscopically Elastically Anisotropic Solids; The Case on Thin Films	p. 363
Interaction between Phases in Co-deforming Two-Phase Materials: The Role of Dislocation Arrangements	p. 391
Grain Surface Relaxation Effects in Powder Diffraction	p. 413
Interface Stress in Polycrystalline Materials	p. 455
Problems Related to X-Ray Stress Analysis in Thin Films in the Presence of Gradients and Texture	p. 473
Two-Dimensional XRD Profile Modelling in Imperfect Epitaxial Layers	p. 505
Three-Dimensional Reciprocal Space Mapping: Application to Polycrystalline CVD Diamond	p. 527
Index	p. 541
Table of Contents provided by Blackwell. All Rights Reserved.

Springer Materials Science

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Hardcover

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