Scanning Probe Microscopy

The Lab on a Tip

By: Ernst Meyer, E. Meyer, Hans Josef Hug

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Hardcover | 27 August 2003

At a Glance

Hardcover
226 Pages

Dimensions(cm)
23.5 x 15.88 x 1.91

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Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.

Industry Reviews

From the reviews:

"This book provides a nice and clearly written introduction to scanning probe microscopy (SPM) ... . It addresses a large audience that ranges from high school teachers to undergraduates to graduate students and post-docs in physics and biology." (opn - Optics & Photonics News, Vol. 16 (9), 2005)

"In this book, the authors aim to give a general introduction to SPM and highlight some of the many applications of this technique. ... the book succeeds in conveying the wide range of SPM techniques and their applications in an enthusiastic manner. ... it is well referenced and will serve as a good starting point for further studies. However, it will be of most use to researchers and students with a particular interest in SFM and MFM." (Steven R Schofield, The Physicist, Vol. 41 (3), May/June, 2004)

"The book is well written and well laid out, providing a good, logical progression from one subject area to the next. Generally, a good balance between theory and experiment is struck, with an appropriate number of quite beautiful images. ... References are plentiful and appropriate ... . the book's sub-title The Lab on a Tip is entirely appropriate. I thoroughly recommend this book to anyone who is interested in applying any SPM technique ... . (Dr. M. Salt, Contemporary Physics, Vol. 45 (6), 2004)

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Non-Fiction Science Science in General Scientific Equipment Microscopy Chemistry Analytical Chemistry Spectrum Analysis Physics Materials & States of Matter

Introduction to Scanning Probe Microscopy	p. 1
Overview	p. 2
Basic Concepts	p. 5
Local Probes	p. 6
Scanning and Control	p. 7
Vibrational Isolation	p. 11
Computer Control and Image Processing	p. 12
Introduction to Scanning Tunneling Microscopy	p. 15
Tunneling: A Quantum-Mechanical Effect	p. 16
Tersoff-Hamann Model	p. 18
Instrumental Aspects	p. 19
Tunneling Tips	p. 19
Implementation in Different Environments	p. 21
Operation Modes	p. 21
ManipulationModes	p. 26
Resolution Limits	p. 29
Imaging of Semiconductors	p. 29
Imaging of Metals	p. 30
Imaging of Layered Materials	p. 31
Imaging of Molecules	p. 32
Imaging of Insulators	p. 33
Theoretical Estimates of Resolution Limits	p. 33
Observation of Confined Electrons	p. 34
Scattering of Surface State Electrons at Steps	p. 34
Scattering of Surface State Electrons at Point Defects	p. 36
Electron Confinement to Nanoscale Boxes	p. 37
Summary of Dispersion Relations for Noble-Metal (111) Surfaces	p. 40
Spin-Polarized Tunneling	p. 41
Observation of the Kondo Effect and Quantum Mirage	p. 44
Force Microscopy	p. 45
Concept and Instrumental Aspects	p. 45
Deflection Sensors: Techniques to Measure Small Cantilever Deflections	p. 45
Spring Constants of Rectangular Cantilevers	p. 46
Cantilever and Tip Preparation	p. 49
Implementations of Force Microscopy	p. 50
Relevant Forces	p. 51
Short-Range Forces	p. 51
Van der Waals Forces	p. 52
Electrostatic Forces	p. 53
Magnetic Forces	p. 55
Capillary Forces	p. 56
Forces in Liquids	p. 57
Operation Modes in Force Microscopy	p. 58
Contact Force Microscopy	p. 61
Topographic Imaging	p. 61
Lateral Resolution and Contact Area	p. 64
Friction Force Microscopy	p. 65
Atomic Friction Processes	p. 67
Lateral Contact Stiffness	p. 70
Velocity Dependence of Atomic Friction	p. 72
Dynamic Force Microscopy	p. 73
Modelling Dynamic Force Microscopy	p. 74
High-Resolution Imaging	p. 76
Spectroscopic Measurements	p. 78
Kelvin Probe Microscopy	p. 79
Dissipation Force Microscopy	p. 81
Tapping Mode Force Microscopy	p. 87
Principles of Operation	p. 87
Phase Imaging	p. 88
Non-Linear Effects	p. 89
Further Modes of Force Microscopy	p. 90
Force Resolution and Thermal Noise	p. 92
MFM and Related Techniques	p. 97
MFM Operation Modes	p. 98
Tip-Sample Distance Control	p. 98
Measurement ofMagnetic Forces	p. 101
Contrast Formation	p. 102
Introduction	p. 102
Stray Fields of Simple Micromagnetic Structures	p. 104
Negligible Modifications	p. 108
Reversible Modifications	p. 115
Irreversible Modifications	p. 119
Separation of Topography and Magnetic Signal	p. 121
Magnetic Resonance Force Microscopy	p. 124
Other Members of the SPM Family	p. 127
Scanning Near-Field Optical Microscopy (SNOM)	p. 127
Scanning Near-Field Acoustic Microscopy (SNAM)	p. 132
Scanning Ion Conductance Microscopy (SICM)	p. 133
Photoemission Microscopy with Scanning Aperture (PEMSA)	p. 135
STM with Inverse Photoemission(STMiP)	p. 135
Laser Scanning Tunneling Microscopy (LSTM)	p. 136
Electrochemical Scanning Tunneling Microscopy (ECSTM)	p. 137
Scanning Thermal Microscopy(SThM)	p. 139
Scanning Noise Microscopy(SNM)	p. 141
Scanning Tunneling Potentiometry (SPotM)	p. 142
Scanning Capacitance Microscopy(SCM)	p. 142
Scanning Spreading Resistance Microscopy (SSRM)	p. 146
Scanning Tunneling Atom Probe (STAP)	p. 150
Artifacts in SPM	p. 153
TipArtifact: Convolution with Tip Shape	p. 153
Influence of Local Inhomogeneities on Topography	p. 160
STM Topography	p. 160
SFM Topography	p. 161
Influence of Topography on Local Measurements	p. 163
STM-Induced Photon Emission	p. 164
Lateral Force Measurement	p. 165
Instrumental Artifacts	p. 167
Piezoelectric Hysteresis, Scanner Creep, Non-Linearities and Calibration Errors	p. 167
Tip Crashes, Feedback Oscillations, Noise, Thermal drift	p. 169
Interference Patterns with Beam Deflection SFM	p. 170
Prospects for SPM	p. 173
Parallel Operation of SFM Cantilever Arrays	p. 173
NovelSensors Based on Cantilevers	p. 175
Gravimetric Sensors	p. 176
Calorimeter Sensors	p. 176
Surface Stress Sensors	p. 176
Cantilever Array Sensors	p. 177
Molecular Electronics	p. 178
Laboratoryon a Tip	p. 179
Local Modification Experiments	p. 179
References	p. 181
Index	p. 207
Table of Contents provided by Publisher. All Rights Reserved.

Scanning Probe Microscopy

The Lab on a Tip

At a Glance

Hardcover

Industry Reviews

Shipping

How to return your order

Defective items

You Can Find This Book In

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