Scanning Nonlinear Dielectric Microscopy

Investigation of ferroelectric, dielectric, and semiconductor materials and de

By: Cho

Write A Review

Paperback | 21 May 2020 | Edition Number 1

At a Glance

Paperback
258 Pages

Dimensions(cm)
22.86 x 15.24 x 1.37

Paperback

RRP $410.95

$362.99

12%OFF

or 4 interest-free payments of $90.75 with

or

Ships in 5 to 7 business days

Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials.

The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry.

Presents an in-depth look at the SNDM materials characterization technique by its inventor
Reviews key materials applications, such as measurement of ferroelectric materials at the nanoscale and measurement of semiconductor materials and devices
Analyzes key insights on semiconductor materials and device physics derived from the SNDM technique

Shipping

	Standard Shipping	Express Shipping
Metro postcodes:	$9.99	$14.95
Regional postcodes:	$9.99	$14.95
Rural postcodes:	$9.99	$14.95

Orders over $89.00 qualify for free shipping.

How to return your order

At Booktopia, we offer hassle-free returns in accordance with our returns policy. If you wish to return an item, please get in touch with Booktopia Customer Care.

Additional postage charges may be applicable.