Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. Scanning Force Microscopy, Revised Edition updates the earlier edition's survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography. Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field.
Industry Reviews
From reviews of the first edition: "Quite instructive as to the capabilities and limitations of the SFM, and should ignite the enthusiasm of those unconverted to high resolution microscopy." --Journal of Colloid and Interface Science
"A valuable contribution to the literature, providing a sound theoretical basis." --Journal of Solid State Chemistry
"A useful introductory source. Its major strength is its concise overview of the different detection methods available and the theoretical noise floor available with each. . . . useful for its discussion of noise sources, and as a supplement to review articles already published in the field." --Andrew A. Gewirth (University of Illinois), Microscopy Research and Technique
"One of the nicest features of the book is a fairly comprehensive, full title, reference list complete to early 1993. Highly recommended to any microscopist working in force microscopy, especially in light of its low cover price."--Microscope
"Presents a theoretical background for scanning force microscopy (SFM) starting from first principles, with experimental and technical information incorporated into each chapter."--Materials Research Bulletin
From reviews of the first edition: "Quite instructive as to the capabilities and limitations of the SFM, and should ignite the enthusiasm of those unconverted to high resolution microscopy." --Journal of Colloid and Interface Science
"A valuable contribution to the literature, providing a sound theoretical basis." --Journal of Solid State Chemistry
"A useful introductory source. Its major strength is its concise overview of the different detection methods available and the theoretical noise floor available with each. . . . useful for its discussion of noise sources, and as a supplement to review articles already published in the field." --Andrew A. Gewirth (University of Illinois), Microscopy Research and Technique
"One of the nicest features of the book is a fairly comprehensive, full title, reference list complete to early 1993. Highly recommended to any microscopist working in force microscopy, especially in light of its low cover price."--Microscope
"Presents a theoretical background for scanning force microscopy (SFM) starting from first principles, with experimental and technical information incorporated into each chapter."--Materials Research Bulletin
