Progress in Materials Analysis

Surface Characterization of Thin Organic Films on Metals.- Analysis of Very Thin Organic Fibres by Means of Small Spots Electron Spectroscopy for Chemical Analysis.- Ion Implantation in the Surface Analysis of Solid Materials.- Comparison of Ion Implantation Profiles Obtained by AES/Sputtering Measurements and Monte Carlo Calculations.- Microfocussed Ion Beams for Surface Analysis and Depth Profiling.- Secondary Neutral Mass Spectrometry Depth Profile Analysis of Silicides.- Analysis of Thin Chromate Layers on Aluminium. I. Opportunities and Limitations of Surface Analytical Methods.- Analysis of Thin Chromate Layers on Aluminium. II. Structure and Composition of No-rinse Conversion Layers.- Surface Analytical Investigation of the Corrosion Behaviour of Ti(Pd) Samples.- Determination of the Lubricant Thickness Distribution on Magnetic Disks by Means of X-Ray Induced Volatilization and Simultaneous Photoelectron Spectroscopy.- Internal Quantification of Glow Discharge Optical Spectroscopy-Depth Profiles of Oxide and Nitride Layers on Metals.- Element Profiling by Secondary Ion Mass Spectrometry of Surface Layers in Glasses.- Neutral Primary Beam Secondary Ion Mass Spectrometry Analysis of Corrosion Phenomena on Glass Surfaces.- Quantitative Distribution Analysis of Phosphorus in Silicon with Secondary Ion Mass Spectrometry.- Positron Studies of Defects in Metals and Semiconductor.- Kossel Technique and Positron Annihilation Used to Clarify Sintering Processes.- Selection and Qualification Tests of High Temperature Materials by Special Microanalytical Methods.- On the Application of Acoustic Emission Analysis to Evaluate the Integrity of Protective Coatings t on High-Temperature Alloys.- Microprobe Measurements to Determine the Melt Equilibria of High-Alloy Nickel Materials.- Experimental Determination of the Depth Distribution of X-Ray Production ?(?z) for X-Ray Energies Below 1 keV.- Electron Probe Microanalysis of Oxygen and Determination of Oxide Film Thickness Using Gaussian ?(?z) Curves.- Procedures to Optimize the Measuring Methods in the Electron Probe Microanalysis of Low Energy X-Rays.- Quantitative Microstructural Analysis of Sintered Silicon Nitride by Using a Thin-Window Energy Dispersive X-Ray Detector System.- Optimizing the Microstructure of Implant Alloy TiA15Fe2.5 by Microprobe Analysis.- Characterization of Technical Surfaces With a Coupled SEM-EDA-Image Analyzer System.- Microanalytical Characterization of a Powder Metallurgical Ledeburitic Tool Steel by Transmission Electron Microscopy.- Determination of the Bonding Behaviour of Carbon and Nitrogen in Micro-Alloyed Structural Steels.- Analytical Electron Microscopy of Rare-Earth Permanent Magnet Materials.