Get Free Shipping on orders over $79
Metrology and Physical Mechanisms in New Generation Ionic Devices : Springer Theses - Umberto Celano

Metrology and Physical Mechanisms in New Generation Ionic Devices

By: Umberto Celano

Paperback | 7 June 2018

At a Glance

Paperback


$169.00

or 4 interest-free payments of $42.25 with

 or 

Ships in 5 to 7 business days

This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed.


Other Editions and Formats

Hardcover

Published: 24th June 2016

More in Spectrum Analysis

Fundamentals of Spectroscopy - Sheldon Davis
XAFS for Everyone - Scott  Calvin

$261.75

Solving Problems with NMR Spectroscopy 2E - Atta-ur-Rahman

RRP $132.95

$114.75

14%
OFF
High-Resolution NMR Techniques in Organic Chemistry, 3E - T.D.W Claridge
A History of Spectroscopy - Emile Biemont

RRP $410.00

$408.99

Electronic Processes in Organic Semiconductors : An Introduction - Anna Köhler
Atomic Spectra : Oxford Chemistry Primers - T. P. Softley