$High Resolution X-Ray Diffractometry And Topography - Brian K. Tanner$

High Resolution X-Ray Diffractometry And Topography

By: Brian K. Tanner, D.K. Bowen

Write A Review

Paperback | 10 October 2019 | Edition Number 1

At a Glance

Paperback
264 Pages

Dimensions(cm)
24.6 x 17.4 x 1.4

Paperback

$248.75

or 4 interest-free payments of $62.19 with

Ships in 10 to 15 business days

The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in research, development, and production. It provides the theoretical and practical background for applying these techniques in scientific and industrial materials characterization. The main aim of the book is to map the theoretical and practical background necessary to the study of single crystal materials by means of high-resolution x-ray diffraction and topography. It combines mathematical formalisms with graphical explanations and hands-on practical advice for interpreting data.

Shipping

	Standard Shipping	Express Shipping
Metro postcodes:	$9.99	$14.95
Regional postcodes:	$9.99	$14.95
Rural postcodes:	$9.99	$14.95

Orders over $79.00 qualify for free shipping.

How to return your order

At Booktopia, we offer hassle-free returns in accordance with our returns policy. If you wish to return an item, please get in touch with Booktopia Customer Care.

Additional postage charges may be applicable.