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High Resolution X-Ray Diffractometry And Topography - D.K. Bowen

High Resolution X-Ray Diffractometry And Topography

By: D.K. Bowen, Brian K. Tanner

eText | 5 February 1998 | Edition Number 1

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The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography. It combines mathematical formalism with graphical explanations and hands-on advice for interpreting data, thus providing the theoretical and practical background for applying these techniques in scientific and industrial materials characterization

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You Can Find This eBook In

Non-FictionEngineering & TechnologyCivil EngineeringEnergy Technology & EngineeringElectrical EngineeringOther Technologies & Applied SciencesApplied OpticsLaser Technology & HolographyMechanical Engineering & MaterialsMaterials ScienceSciencePhysics
Optical Physics

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Published: 10th October 2019

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