
Fourier Transform Spectrometry
By: Sumner P. Davis, Mark C. Abrams, James W. Brault
Hardcover | 21 May 2001
At a Glance
276 Pages
22.86 x 15.88 x 2.54
Hardcover
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Due to the increasing complexity and commercialization of instrumentation, achieving optimum performance in research applications and automated usage can be challenging. For example, a thorough understanding of the instrument can dramatically affect the outcome of the experiment and the generation of reliable data in applications where conditions are not ideal and resulting signals are weak. This book provides a comprehensive discussion of FTS from the ground up, covering basic concepts, instrumentation, data-processing algorithms, and techniques for computerized spectral analysis.
| Preface | p. xiii |
| Introduction | p. 1 |
| Spectra and Spectroscopic Measurement | p. 5 |
| The Classical Michelson Interferometer | p. 10 |
| Precision, Accuracy, and Dynamic Range | p. 12 |
| Units | p. 13 |
| A Glance Ahead and to the Side | p. 15 |
| Why Choose a Fourier Transform Spectrometer? | p. 17 |
| Quantity | p. 18 |
| Quality | p. 20 |
| Resolution and Line Shape | p. 20 |
| Fixed and Variable Quantities in Experiments | p. 21 |
| Cost | p. 24 |
| Summary | p. 25 |
| Theory of the Ideal Instrument | p. 29 |
| Equation for the Balanced Output | p. 31 |
| The Unbalanced Output | p. 32 |
| From Monochromatic to Broadband Light | p. 33 |
| Generalization to Polychromatic Light | p. 35 |
| Extension to Plus and Minus Infinity | p. 35 |
| The Fourier Transform Spectrometer as a Modulator | p. 36 |
| Summary | p. 37 |
| Fourier Analysis | p. 41 |
| Linear Systems and Superposition | p. 42 |
| A Practical Approach to Fourier's Theorem | p. 43 |
| Fourier Decomposition | p. 46 |
| Representations of Functions and Their Transforms | p. 47 |
| Practical Representations | p. 49 |
| Linear Systems and Convolution | p. 49 |
| Cross-Correlation | p. 52 |
| Definition of a Signal-to-Noise Ratio | p. 53 |
| Generalized Functions | p. 54 |
| The Dirac Delta Function | p. 54 |
| The Dirac Comb and Sampling of Continuous Functions | p. 55 |
| The Essential Theorems | p. 57 |
| Addition (Superposition) | p. 57 |
| Similarity (Stretching) | p. 58 |
| Shift | p. 58 |
| Modulation | p. 58 |
| Convolution (Folding Rule) | p. 59 |
| Autocorrelation | p. 60 |
| Derivative | p. 61 |
| Derivatives of a Convolution Integral | p. 62 |
| Rayleigh Theorem | p. 62 |
| Power | p. 63 |
| Zeroth Moment (Area) | p. 63 |
| Examples of Transform Pairs Fundamental to FTS | p. 63 |
| Nonideal (Real-World) Interferograms | p. 67 |
| Finite Path Difference | p. 68 |
| Finite Entrance Aperture Size | p. 69 |
| Finite Instrumental Function and its Properties | p. 73 |
| Non-uniform or Non-symmetric Irradiation of the Aperture | p. 79 |
| Working with Digital Spectra and Fourier Transforms | p. 80 |
| Signals and Measurement | p. 83 |
| Discrete Transforms | p. 86 |
| Interpolation in the Spectrum | p. 87 |
| Apodization | p. 93 |
| Preparation for Making Transforms | p. 98 |
| Common Artifacts | p. 98 |
| Zero Mean Interferograms, End Effects, and Masking | p. 98 |
| Procedure for Reliable Transforms | p. 98 |
| Phase Corrections and Their Significance | p. 101 |
| The What and Why of Phase | p. 101 |
| Origins of Asymmetries in the Interferogram | p. 102 |
| From Asymmetries to Phase Errors | p. 102 |
| Asymmetric Truncation, Amertization, and Phase Errors | p. 107 |
| More on One-Sided vs. Symmetric Interferograms | p. 112 |
| Determining Phase Shifts | p. 112 |
| Low-Resolution Phase Determination | p. 114 |
| High-Resolution Phase Determination | p. 116 |
| Recommendations | p. 116 |
| Effects of Noise in Its Various Forms | p. 119 |
| Signal and Noise in the Two Domains | p. 120 |
| Noise Classifications | p. 122 |
| Detector Noise (k = 0): The Multiplex Advantage | p. 122 |
| Digitizing Noise (k = 0): Dynamic Range | p. 123 |
| Photon Noise (k = 0.5) | p. 126 |
| Source Noise (k = 1) | p. 131 |
| Unbalance, Misalignment, Modulation Efficiency, and Signal-to-Noise | p. 133 |
| Noise Limited Resolution | p. 134 |
| Localized Noise (Ghosts and Artifacts) | p. 134 |
| Periodic Position Error Ghosts | p. 136 |
| Coherent Ghosts | p. 136 |
| Ringing Ghosts | p. 139 |
| Summary | p. 140 |
| Line Positions, Line Profiles, and Fitting | p. 143 |
| Introduction | p. 143 |
| Line Finding and Line Shapes | p. 144 |
| Emission Lines | p. 144 |
| Absorption Lines | p. 144 |
| Derivative Line Finding | p. 145 |
| Kernel Functions | p. 145 |
| Line Position Accuracy | p. 148 |
| Useful Line-Finding Properties of First and Second Derivatives | p. 149 |
| Techniques of Derivative Line-Finding | p. 150 |
| Noise and Filtered Derivative Line-Finding | p. 150 |
| Resolution and Line-Finding | p. 152 |
| Least Square Fitting of Line Profiles to Voigtian Functions | p. 154 |
| Voigtian Functions | p. 154 |
| Fitting Considerations | p. 155 |
| Special Problems in Fitting Voigtian Functions | p. 157 |
| Fitting Errors from Sampling | p. 158 |
| Fitting Errors from Noise | p. 158 |
| Fitting Errors from the Sampling Grid | p. 160 |
| Fitting Underresolved Spectra | p. 160 |
| Rates of Convergence | p. 163 |
| Areas and Equivalent Widths | p. 165 |
| Wavenumber Calibration | p. 166 |
| Processing of Spectral Data | p. 169 |
| Emission Background Subtraction and Intensity Correction | p. 170 |
| Absorption Background and Intensity Corrections | p. 173 |
| Line Lists and Fitting | p. 175 |
| Discussions, Interventions, Digressions, and Obscurations | p. 179 |
| A Novel Approach to Sampling Systems | p. 181 |
| Introduction | p. 181 |
| Position Measurements | p. 182 |
| Sampling Systems | p. 183 |
| A New Approach to Sampling Systems | p. 184 |
| Practical Realization, Results, and Implications | p. 185 |
| The Imaging Fourier Transform Spectrometer (IFTS) | p. 186 |
| Characterization and Determination of Instrumental Line Shape Functions | p. 189 |
| Apodization | p. 190 |
| Introduction | p. 190 |
| Selected Apodization Functions/Windows | p. 192 |
| Evaluation Criteria and Relative Performance | p. 195 |
| Families of Functions | p. 196 |
| Method of Optimization | p. 196 |
| Some Useful Functions for Optimal Apodization | p. 196 |
| Discussion | p. 198 |
| To Apodize or Not to Apodize--Case Studies | p. 198 |
| The Quest for the Perfect Instrument | p. 199 |
| On Fourier Transform Spectrometry and Digital Signal Processing | p. 204 |
| From Echelle Spectrographs to Echelle Spectrographs--A 50-Year Circle | p. 205 |
| A Final Story | p. 211 |
| Chapter-by-Chapter Bibliography | p. 213 |
| Chronological Bibliography | p. 223 |
| Applications Bibliography | p. 233 |
| Author Bibliography | p. 243 |
| Index | p. 259 |
| Table of Contents provided by Syndetics. All Rights Reserved. |
ISBN: 9780120425105
ISBN-10: 0120425106
Published: 21st May 2001
Format: Hardcover
Language: English
Number of Pages: 276
Audience: General Adult
Publisher: Academic Press
Country of Publication: US
Dimensions (cm): 22.86 x 15.88 x 2.54
Weight (kg): 0.41
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