Electron and Ion Microscopy and Microanalysis
Principles and Applications, Second Edition,
By: Lawrence E Murr (Editor)
Paperback | 29 October 2019 | Edition Number 2
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Paperback
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ISBN: 9780367402945
ISBN-10: 0367402947
Series: Optical Science and Engineering
Published: 29th October 2019
Format: Paperback
Language: English
Number of Pages: 856
Audience: Professional and Scholarly
Publisher: Taylor & Francis Ltd
Country of Publication: GB
Edition Number: 2
Edition Type: New edition
Dimensions (cm): 25.4 x 17.78 x 4.32
Weight (kg): 1.45
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