| Preface | |
| Materials Research Society Symposium Proceedings | |
| Low-Frequency Scanning Capacitance Microscopy | p. 3 |
| Resistometric Mapping Using a Scanning Tunneling Microscope | p. 15 |
| Micromachined SFM Probes for High-Frequency Electric and Magnetic Fields | p. 21 |
| Measurement of Stratified Distributions of Dielectric Properties and Dependent Physical Parameters | p. 29 |
| Understanding Coating and Substrate Heterogeneities Using Electrochemical Impedance Methods | p. 35 |
| Electromechanical Study of Carbon Fiber Composites | p. 43 |
| Formation of Dislocations in NiAl Single Crystals Studied by In Situ Electrical Resistivity Measurement | p. 49 |
| A Novel Approach to Semiconductor Electrical Properties - The Advanced Method of Transient Microwave Photoconductivity (AMTMP) | p. 57 |
| Microstructural and Electrical Characterization of Misfit Dislocations at the InAs/GaP Heterointerface | p. 63 |
| Electrical Measurement of the Bandgap of N[superscript +] and P[superscript +] SiGe Formed by Ge Ion Implantation | p. 69 |
| Investigation of the Dopant Distribution in Thin Epitaxial Silicon Layers by Means of Spreading Resistance Probe and Secondary Ion Mass Spectrometry | p. 75 |
| Evaluation of Gap States in Hydrogen-Terminated Silicon Surfaces and Ultrathin SiO[subscript 2]/Si Interfaces by Using Photoelectron Yield Spectroscopy | p. 81 |
| Conductance Transients Study of Slow Traps in Al/SiN[subscript x]:H/Si and Al/SiN[subscript x]:H/InP Metal-Insulator-Semiconductor Structures | p. 87 |
| The Influence of Ionic Activity on the Electrical Properties of PECVD (TEOS) Silicon Dioxide | p. 93 |
| Analysis of TEOS Silicon Dioxide: The Identification of Carbonatious Contaminants | p. 97 |
| Electrical Properties of Integrated Ta[subscript 2]O[subscript 5] Metal-Insulator-Metal Capacitors | p. 101 |
| Effects of Sc or Tb Addition on the Microstructures and Resistivities of Al Thin Films | p. 107 |
| Electrical Properties of Novel Anodic Films Formed in Nonaqueous Electrolyte Solutions | p. 113 |
| Anodic Oxidation of Nitrogen-Added Al-Based Alloys for Thin-Film Transistors | p. 119 |
| Nucleation and Growth at Reactive Interfaces Followed by Impedance Measurements | p. 125 |
| Giant Magnetoimpedance: A Relevant Application of Impedance Spectroscopy | p. 133 |
| Electromagnetic Properties of Soils | p. 137 |
| Magnetic Transitions Studied by Electrically-Based Methods in Mn-Zn Ferrite | p. 147 |
| Application of Broad-Band Dielectric Spectroscopy for Investigations of Liquid Crystal-Porous Media Microcomposites | p. 151 |
| Study of the Molecular Mobility of Polysaccharide Solid Thin Layers by Dielectric Relaxation Spectroscopy | p. 157 |
| Universality of Dielectric Response as an Aid to Diagnostics | p. 167 |
| The Dielectric Loss of Single Crystal and Polycrystalline TiO[subscript 2] | p. 183 |
| Very Low Loss Ceramic Dielectric Resonator Materials | p. 189 |
| Complex Dielectric Spectroscopy Characterization of a Li[subscript 0.982]Ta[subscript 1.004]O[subscript 3] Ferroelectric Single Crystal | p. 195 |
| Time Domain Response of Electrical Ceramics Micro to Megaseconds | p. 203 |
| Quantitative ICTS Measurement of Interface States at Grain Boundaries in ZnO Varistors | p. 213 |
| Current Localization, Non-Uniform Heating, and Failures of ZnO Varistors | p. 221 |
| Current Flow and Structural Inhomogeneities in Nonlinear Materials | p. 235 |
| High-Power Switching Behavior in Conductor-Filled Polymer Composites | p. 247 |
| Computer Simulation of ZnO Varistors Failures | p. 253 |
| Non-Debye and CPA Behaviors of Ionic Materials | p. 261 |
| Impedance Spectroscopy of Nanocrystalline Y-Stabilized Tetragonal Zirconia | p. 273 |
| Microstructural Correlation with Electrical Properties for Y[subscript 2]O[subscript 3]-Doped CeO[subscript 2] Thin Films | p. 279 |
| Correlation Between Electrical Properties and Composition/Microstructure of Si-C-N Ceramics | p. 285 |
| The Use of Computer Simulations to Interpret and Understand Electrical Measurements | p. 291 |
| Characterizing the Dispersion of Constituents in Concrete by Electrical Resistivity | p. 303 |
| Electrochemical Corrosion of Electrodes in a Simulated Nuclear Waste Glass Melt | p. 309 |
| Extended D.C. Electrical Transport Measurements on the Mixed Conductor Cu[subscript 3]CS[subscript 2] | p. 315 |
| Stability and Conductivity of Gd[subscript 2]((Mo[subscript 1/3]Mn[subscript 2/3])[subscript x]Ti[subscript 1-x])[subscript 2]O[subscript 7] | p. 321 |
| Composition-Dependent Electrical Conductivity of Ionic-Electronic Composite | p. 327 |
| Comparison of Techniques for Microwave Characterization of Percolating Dielectric - Metallic Media and Resolution of Discrepancies in Measured Data | p. 335 |
| Dielectric Spectroscopy of Insulator/Conductor Composites | p. 341 |
| Computer Simulation of Impedance for 2-D Conductor-Insulator Composite | p. 347 |
| Scaling Behavior of the Complex Conductivity of Graphite-Boron Nitride Percolation Systems | p. 351 |
| Conductivity and Noise Measurements in 3-D Percolative Cellular Structures | p. 357 |
| Author Index | p. 363 |
| Subject Index | p. 365 |
| Table of Contents provided by Blackwell. All Rights Reserved. |
