Defect Recognition and Image Processing in Semiconductors 1997
Proceedings of the seventh conference on Defect Recognition and Image Processing, Berlin, September 1997
By: J. Doneker
Hardcover | 1 January 1998 | Edition Number 1
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Hardcover
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ISBN: 9780750305006
ISBN-10: 0750305002
Series: Institute of Physics Conference Series
Published: 1st January 1998
Format: Hardcover
Language: English
Number of Pages: 548
Audience: Professional and Scholarly
Publisher: Taylor & Francis Ltd
Country of Publication: GB
Edition Number: 1
Dimensions (cm): 23.4 x 15.6 x 3.02
Weight (kg): 0.94
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This product is categorised by
- Non-FictionSciencePhysicsMaterials & States of MatterCondensed Matter Physics including Liquid State & Solid State Physics
- Non-FictionEngineering & TechnologyMechanical Engineering & MaterialsMaterials Science
- Non-FictionEngineering & TechnologyElectronics & Communications EngineeringElectronics EngineeringElectronic Devices & MaterialsSemi-Conductors & Super-Conductors
- Non-FictionComputing & I.T.Computer ScienceImage Processing