| Preface to the second English edition | p. ix |
| Preface to the first edition | p. xi |
| Introduction | p. 1 |
| Abbe's sine condition | p. 9 |
| Fourier optics | p. 23 |
| Effect of polarization on diffraction in systems of high numerical aperture | p. 45 |
| Gaussian beam optics | p. 52 |
| Coherent and incoherent imaging | p. 62 |
| First-order temporal coherence in classical optics | p. 74 |
| The van Cittert-Zernike theorem | p. 88 |
| Partial polarization, Stokes parameters, and the Poincare sphere | p. 100 |
| Second-order coherence and the Hanbury Brown-Twiss experiment | p. 113 |
| What in the world are surface plasmons? | p. 128 |
| Surface plasmon polaritons on metallic surfaces | p. 139 |
| The Faraday effect | p. 152 |
| The magneto-optical Kerr effect | p. 166 |
| The Sagnac interferometer | p. 182 |
| Fabry-Perot etalons in polarized light | p. 197 |
| The Ewald-Oseen extinction theorem | p. 209 |
| Reciprocity in classical linear optics | p. 224 |
| Optical pulse compression | p. 240 |
| The uncertainty principle in classical optics | p. 258 |
| Omni-directional dielectric mirrors | p. 274 |
| Linear optical vortices | p. 289 |
| Geometric-optical rays, Poynting's vector, and the field momenta | p. 301 |
| Doppler shift, stellar aberration, and convection of light by moving media | p. 310 |
| Diffraction gratings | p. 323 |
| Diffractive optical elements | p. 351 |
| The Talbot effect | p. 367 |
| Some quirks of total internal reflection | p. 379 |
| Evanescent coupling | p. 387 |
| Internal and external conical refraction | p. 404 |
| Transmission of light through small elliptical apertures | p. 418 |
| The method of Fox and Li | p. 447 |
| The beam propagation method | p. 459 |
| Launching light into a fiber | p. 476 |
| The optics of semiconductor diode lasers | p. 489 |
| Michelson's stellar interferometer | p. 505 |
| Bracewell's interferometric telescope | p. 515 |
| Scanning optical microscopy | p. 525 |
| Zernike's method of phase contrast | p. 545 |
| Polarization microscopy | p. 554 |
| Nomarski's differential interference contrast microscope | p. 566 |
| The van Leeuwenhoek microscope | p. 576 |
| Projection photolithography | p. 586 |
| Interaction of light with subwavelength structures | p. 599 |
| The Ronchi test | p. 614 |
| The Shack-Hartmann wavefront sensor | p. 624 |
| Ellipsometry | p. 632 |
| Holography and holographic interferometry | p. 642 |
| Self-focusing in nonlinear optical media | p. 654 |
| Spatial optical solitons | p. 664 |
| Laser heating of multilayer stacks | p. 678 |
| Index | p. 691 |
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