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Chapman & Hall/CRC Machine Learning & Pattern Recognition : Chapman & Hall/CRC Machine Learning & Pattern Recognition - Liang Sun

Chapman & Hall/CRC Machine Learning & Pattern Recognition

By: Liang Sun, Shuiwang Ji, Jieping Ye

Hardcover | 4 November 2013 | Edition Number 1

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Similar to other data mining and machine learning tasks, multi-label learning suffers from dimensionality. An effective way to mitigate this problem is through dimensionality reduction, which extracts a small number of features by removing irrelevant, redundant, and noisy information. The data mining and machine learning literature currently lacks a unified treatment of multi-label dimensionality reduction that incorporates both algorithmic developments and applications.

Addressing this shortfall, Multi-Label Dimensionality Reduction covers the methodological developments, theoretical properties, computational aspects, and applications of many multi-label dimensionality reduction algorithms. It explores numerous research questions, including:

  • How to fully exploit label correlations for effective dimensionality reduction
  • How to scale dimensionality reduction algorithms to large-scale problems
  • How to effectively combine dimensionality reduction with classification
  • How to derive sparse dimensionality reduction algorithms to enhance model interpretability
  • How to perform multi-label dimensionality reduction effectively in practical applications

The authors emphasize their extensive work on dimensionality reduction for multi-label learning. Using a case study of Drosophila gene expression pattern image annotation, they demonstrate how to apply multi-label dimensionality reduction algorithms to solve real-world problems. A supplementary website provides a MATLAB® package for implementing popular dimensionality reduction algorithms.

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