Applied Scanning Probe Methods III

Characterization

By: Bharat Bhushan (Editor), Harald Fuchs (Editor)

Write A Review

Hardcover | 22 February 2006

At a Glance

Hardcover
424 Pages

Dimensions(cm)
24.13 x 17.15 x 1.91

Hardcover

$249.00

or 4 interest-free payments of $62.25 with

Ships in 7 to 10 business days

The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate single atoms. At ?rst there were two - the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the - gneticForceMicroscope,MFM,and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes.

Industry Reviews

From the reviews:

"The editors have done a good job in making the various chapters quite readable and most of the chapters are well written on a level that will be accessible to most readers. ... As is usually the case with Springer books, these volumes have been beautifully printed, illustrated, and nicely bound for long term durability." (Gary J. Long & Fernande Grandjean, Physicalia Magazine, Vol. 29 (4), 2007

Shipping

	Standard Shipping	Express Shipping
Metro postcodes:	$9.99	$14.95
Regional postcodes:	$9.99	$14.95
Rural postcodes:	$9.99	$14.95

Orders over $79.00 qualify for free shipping.

How to return your order

At Booktopia, we offer hassle-free returns in accordance with our returns policy. If you wish to return an item, please get in touch with Booktopia Customer Care.

Additional postage charges may be applicable.

Defective items

If there is a problem with any of the items received for your order then the Booktopia Customer Care team is ready to assist you.

For more info please visit our Help Centre.

Atomic Force Microscopy in Nanomedicine	p. 1
AFM in Biological Sciences	p. 1
Plasma Membrane Preparation for AFM Imaging	p. 4
Introduction	p. 4
Plasma Membrane Preparation	p. 5
Atomic Force Microscopy	p. 7
Molecular Volume Measurements of Membrane Proteins	p. 7
AFM Imaging	p. 7
AFM Imaging of CFTR in Oocyte Membranes	p. 10
Introduction	p. 11
Does the CFTR Form Functional Assemblies?	p. 11
Two CFTRs are Better Than One	p. 13
Single Antibody-CFTR Recognition Imaging	p. 16
Introduction	p. 16
Tethering of Antibodies to AFM Tips	p. 17
AFM Imaging and Recognition	p. 17
A Single Antibody Sees a Single CFTR	p. 17
Single Cell Elasticity: Probing for Diseases	p. 19
Introduction	p. 19
Force-Mapping AFM	p. 20
Can One Protein Change Cell Elasticity?	p. 21
Summary	p. 24
References	p. 24
Scanning Probe Microscopy: From Living Cells to the Subatomic Range	p. 27
Introduction	p. 27
Cells In Vivo as Exemplified by Diatoms	p. 28
Introduction to Diatoms	p. 28
SPM of Diatoms	p. 30
Interaction of Large Organic Molecules	p. 33
Nanodefects on Atomically Flat Surfaces	p. 37
Ion Bombardment of Highly Oriented Pyrolytic Graphite (HOPG)	p. 38
Bombardment of Single Crystal Insulators with Multicharged Ions	p. 42
Subatomic Features	p. 45
Atom Orbitals	p. 45
Single Electron Spin Detection with AFM and STM	p. 47
Conclusions and Outlook	p. 50
References	p. 51
Surface Characterization and Adhesion and Friction Properties of Hydrophobic Leaf Surfaces and Nanopatterned Polymers for Superhydrophobic Surfaces	p. 55
Introduction	p. 55
Experimental Details	p. 58
Instrumentation	p. 58
Samples	p. 59
Roughness Factor	p. 61
Test Matrix for Nanopatterned Polymers	p. 62
Results and Discussion	p. 63
Hydrophobic Leaf Surfaces	p. 64
Nanopatterned Polymers	p. 74
Summary	p. 79
References	p. 81
Probing Macromolecular Dynamics and the Influence of Finite Size Effects	p. 83
Introduction	p. 84
The Glass Transition and Molecular Mobility	p. 85
Macromolecular Probing Techniques	p. 90
Static Contacts	p. 90
Modulated Contacts	p. 92
Calibration of Lateral Forces in Scanning Probe Microscopy	p. 93
Shear Modulation Force Microscopy (SM-FM)	p. 97
Friction Force Microscopy (FFM)	p. 98
Tribological Models for FFM	p. 99
Internal Friction and Dynamics near the Glass Transition	p. 103
Molecular Relaxations	p. 103
Structural Heterogeneity and Relaxation near the Glass Transition	p. 105
Cooperative Molecular Motion During the Glass Transition	p. 107
Constraints and Structural Modifications near Interfaces	p. 109
Interfacial Plasticization	p. 109
Dewetting Kinetics	p. 110
Disentanglement Barriers	p. 111
Interfacial Glass Transition Profiles	p. 113
Mechanical Operations in Nanoscopic Polymer Systems	p. 115
Indentation Contact Mechanics	p. 116
Rim Formation During Indentation	p. 120
Strain Shielding and Confined Plasticity in Nanoscopic Polymer Systems	p. 122
Closing Remarks	p. 126
References	p. 127
Investigation of Organic Supramolecules by Scanning Probe Microscopy in Ultra-High Vacuum	p. 131
Introduction	p. 131
Methods	p. 132
Organic Molecular Beam Epitaxy (OMBE)	p. 132
Scanning Tunneling Microscopy (STM)	p. 134
Atomic Force Microscopy (AFM)	p. 137
Molecules	p. 142
Fullerenes	p. 142
Porphyrins	p. 142
Phthalocyanines	p. 142
Perylene Derivatives	p. 144
Lander Molecules	p. 144
PVBA Molecules	p. 144
Decacyclene and Derivatives	p. 144
Molecules on Metals	p. 145
STM Investigations	p. 145
Non-Contact AFM Investigations	p. 157
Molecules on Semiconductor Surfaces	p. 162
STM Investigations	p. 162
Non-Contact AFM Investigations	p. 165
Molecules on Insulating Surfaces	p. 167
STM Investigations	p. 168
Non-contact AFM Investigations	p. 169
Manipulation of Single Molecules	p. 171
STM Investigations	p. 171
Non-contact AFM Investigations	p. 175
Conclusions	p. 175
References	p. 176
One- and Two-Dimensional Systems: Scanning Tunneling Microscopy and Spectroscopy of Organic and Inorganic Structures	p. 183
Introduction	p. 183
Basic Principles of STM and STS	p. 185
Inorganic Overlayers	p. 188
1D Structures	p. 188
2D Structures	p. 196
Molecular Overlayers	p. 201
1D Structures	p. 202
2D Overlayers	p. 208
Conclusions	p. 212
References	p. 212
Scanning Probe Microscopy Applied to Ferroelectric Materials	p. 217
Introduction	p. 217
Development of Scanning Probe Techniques for Ferroelectrics	p. 217
Scanning Force Microscopy	p. 220
Non-Contact Mode	p. 220
Contact Mode	p. 221
Voltage-Modulated SFM	p. 222
Resonance Modes of EFM	p. 224
Lateral Force	p. 228
Frontal Force	p. 232
Second Harmonic	p. 233
Tapping Mode	p. 234
Scanning Optical Microscopy	p. 235
Pure Optical Microscopy	p. 235
Scanning Electrooptic Microscopy	p. 237
Near-Field Electrooptic Microscopy	p. 242
Micro-Spectroscopic Techniques	p. 244
Second Harmonic Microscopy	p. 245
Applications to Ferroelectrics	p. 247
Imaging of Domains and Domain Walls	p. 247
Writing Patterns	p. 248
Phase Transitions	p. 249
Morphotropic Phase Boundary	p. 250
Relaxors	p. 251
Thin Films	p. 251
Artificial Nanostructures	p. 252
Conclusions	p. 253
References	p. 254
Morphological and Tribological Characterization of Rough Surfaces by Atomic Force Microscopy	p. 261
Characterization of Surface Roughness by Atomic Force Microscopy	p. 263
Statistical Methods for Stationary Random Surfaces	p. 264
Statistical Methods for Fractal Surfaces	p. 266
Estimation of Morphological Parameters from AFM Topographies	p. 270
Modeling Contact Mechanics for Rough Surfaces	p. 272
Early Phenomenological Contact Theories	p. 273
Contact Mechanics Theories for Fractal Roughness	p. 277
On the Molecular Origins of Amontons' Law	p. 284
Investigations of Multi-Asperity Contacts by AFM	p. 286
AFM Characterization of Surface Roughness for Tribological Purposes	p. 286
Contact Mechanics Investigations at the Nanometer Scale	p. 288
Contact Mechanics Investigations on the Micrometer Scale	p. 291
Conclusions	p. 293
References	p. 294
AFM Applications for Contact and Wear Simulation	p. 299
Introduction	p. 299
Scale Factor in Tribology	p. 299
AFM as a Tool of Contact Simulation	p. 300
Contact of Rough Surfaces	p. 300
Rough Contact with Adhesion	p. 303
Multilevel Contact Models	p. 307
Simulation of Contact Using AFM Images	p. 309
Nanomechanical Probing of Soft Layers	p. 312
AFM in Wear Simulation	p. 316
Nanoscratching and Nanowear with AFM Tip	p. 317
Wear Simulation in AFM Contact Mode	p. 320
Conclusions	p. 323
References	p. 324
AFM Applications for Analysis of Fullerene-Like Nanoparticles	p. 327
Introduction	p. 327
Instrumentation	p. 328
Friction Experiment	p. 328
AFM Experiment	p. 329
Characterization of Fullerene-Like Solid Lubricant Nanoparticles	p. 330
Friction of Solid Lubricant Films	p. 331
Friction and Wear of the Surfaces Lubricated with Oil + IF Nanoparticles	p. 333
Friction of IF Nanoparticles Under Severe Contact Conditions	p. 336
Mechanisms of Friction of the IF Nanoparticles	p. 339
Conclusions	p. 341
References	p. 341
Scanning Probe Methods in the Magnetic Tape Industry	p. 343
Introduction	p. 343
Atomic Force Microscopy	p. 345
Topographic Characterization of the Magnetic Tape	p. 345
Topographic Characterization of Heads	p. 349
Tape Roughness Analysis	p. 351
Magnetic Force Microscopy	p. 358
Methodology	p. 358
Characterization of the Magnetic Tape with MFM	p. 359
Characterization of Heads with MFM	p. 364
Conclusions	p. 367
References	p. 367
Subject Index	p. 371
Table of Contents provided by Ingram. All Rights Reserved.

Applied Scanning Probe Methods III

Characterization

At a Glance

Hardcover

Industry Reviews

Shipping

How to return your order

Defective items

You Can Find This Book In

More in Analytical Chemistry

Fundamentals of Spectroscopy

Analytical Chemistry

An Introduction

An Introduction to Medicinal Chemistry

7th Edition

Principles of Instrumental Analysis

7th edition

XAFS for Everyone

Handbook of Acid-Base Indicators

pH Indicators

ASTRONOMICAL SPECTROSCOPY (2ND ED)

An Introduction To The Atomic And Molecular Physics Of Astronomical Spectra (2nd Edition)

Child-Centered Play Therapy

A Practical Guide to Therapeutic Relationships with Children

Green Chemistry in Nanotechnology for Sustainable Synthesis, Characterization, and Applications of Nanoparticles

Green Chemistry and Sustainability

Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists

Advances in Materials Science and Engineering

The Book of the Light of the Great Magistery of John of Rupescissa (Liber lucis magisterii magni)

Sources of Alchemy and Chemistry: Sir Robert Mond Studies in the History of Early Chemistry

Essential Oil Extraction, Scalability Concerns, and Process Intensification

A Comprehensive Guide

Electrochemistry of Natural Compounds

Substance Abuse in Special Populations

Pharmacology, Analysis and Management

Substance Abuse in Special Populations

Pharmacology, Analysis and Management

Poly(vinylpyridine)

Structure, Properties, Synthesis, and Applications

Supercapacitor

Fundamentals, Materials, and Devices

Essentials of Forensic Analytical Toxicology

Adsorptive Separation Process for Water and Gaseous Air Pollution Control

Theory and Applications

Bioseparations Science And Engineering 3rd Edition

Topics in Chemical Engineering

A History of Spectroscopy

Ultrafast Structural Dynamics of Free Molecules and Condensed Matter

Green Chemistry in Food Analysis

Food Analysis & Properties

Differential Optical Absorption Spectroscopy

Principles and Applications

This product is categorised by