X-ray Absorption Fine Structure For Catalysts And Surfaces

By: Y. Iwasawa (Editor)

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Hardcover | 1 May 1996

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428 Pages

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23.5 x 17.15 x 2.54

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X-ray absorption fine structure (XAFS) is a powerful technique in characterization of structures and electronic states of materials in many research fields including catalysts, semiconductors, optical ingredients, magnetic materials, and surfaces. This characterization technique is possible not only in a static state but also in a dynamic state (in-situ condition). The XAFS can provide information that is not possible by other techniques for characterization of materials, particularly catalysts and related surfaces. Furthermore, XAFS can provide molecular-level approach to mechanistic study for understanding of catalysts and developing of catalysts. A number of synchrotron radiation facilities have been planned to be built in Asian countries in addition to the high-brilliant synchrotron radiation facilities under construction in the USA, Europe, and Japan. The fields of XAFS are now expanded to catalytic chemistry and engineering, surface science, organometallic chemistry, materials science, solid-state chemistry, geophysics, etc. This book is intended for the widest range of researchers and students working in the domain or related topics.

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Preface
Introduction	p. 1
Theory and Parameters of EXAFS	p. 8
Analysis of EXAFS	p. 33
Theory and Analysis of XANES	p. 59
MO Approach	p. 60
Multiple Scattering Approach	p. 77
Measurement of XAFS	p. 92
Instrumentation	p. 93
In Situ XAFS Measurement of Catalysts	p. 113
Laboratory XAFS	p. 130
Applications of EXAFS to Catalyst Characterization	p. 146
Supported Bimetallic Cluster Catalysts	p. 147
Metal Clusters and Particles in Zeolites	p. 173
Metal Oxide Catalysts	p. 192
Supported Multimetal Sites	p. 216
Sulfide Catalysts	p. 235
The Metal-Support Interface in Supported Metal Catalysts	p. 257
Applications of XANES to Catalyst Characterization	p. 275
Supported Metal Particles	p. 276
Metal Oxide Catalysts	p. 304
Others	p. 326
New Techniques for Catalysts and Surfaces	p. 331
Total-Reflection XAFS	p. 332
Combined EXAFS/XRD Methods	p. 345
Surface EXAFS and Soft X-ray Standing Wave Methods	p. 354
In Situ NEXAFS Characterization of Surface Intermediates	p. 362
Diffraction Anomalous Fine Structure (DAFS)	p. 372
XAFS Using High Brilliance Photon Sources	p. 383
Index	p. 393
Table of Contents provided by Blackwell. All Rights Reserved.

X-ray Absorption Fine Structure For Catalysts And Surfaces

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Hardcover

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