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Thin-Film Capacitors for Packaged Electronics - Jain Pushkar

Thin-Film Capacitors for Packaged Electronics

Hardcover Published: 30th November 2003
ISBN: 9781402077050
Number Of Pages: 158

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Capacitors were invented in 1745 and have served as portable electrical charge storage devices ever since. During the 19th century a general understanding of electro-magnetism was gradually developed. Electronic devices and circuits were pioneered in the early 20th century and, by its end, revolutionized the generation, processing, storage and transmission of information. No evolutionary limits have yet been approached.
Strictly speaking, all circuits have capacitors; often not wanted, considered parasitic capacitors, such as capacitance of signal interconnections. A great deal of effort in academia and industry attempts to reduce the value of the parasitic capacitors by means of novel materials and structures with the lowest dielectric constant. Thin-Film Capacitors for Packaged Electronics deals with the capacitors of a wanted kind, still needed and capable of keeping pace with the demands posed by ever greater levels of integration. It spans a wide range of topics, from materials properties to limits of what's the best one can achieve in capacitor properties to process modeling to application examples. Some of the topics covered are the following:

-Novel insights into fundamental relationships between dielectric constant and the breakdown field of materials and related capacitance density and breakdown voltage of capacitor structures,
-Electrical characterization techniques for a wide range of frequencies (1 kHz to 20 GHz),
-Process modeling to determine stable operating points,
-Prevention of metal (Cu) diffusion into the dielectric,
-Measurements and modeling of the dielectric micro-roughness.

Capacitor Fundamentals
Application Domains
Physical Structures/Embodiments
Capacitor Integration Drivers
Thin-Film Capacitor Technology
Design Fundamentals
Breakdown Voltage and Capacitance Density Design Limits
Tolerance in Capacitance Density
DC Leakage
Capacitor Losses
Series Inductance and Resistance
Performance Detractors
Interfacial Micro-roughness
Deviation from Optimal Stoichiometry
Film Microstructure
Electrical Characterization
Thin Film Decoupling Capacitors
Characterization Methodologies
Test Vehicle: Design and Fabrication
Dielectric Constant and Loss
Total Series Inductance
Leakage Current Density
Capacitance Density and Breakdown Field
Summary and Conclusion
Integration Issues And Challenges
Metal Diffusion into Dielectrics
Interlayer Stresses and Adhesion
Low Thermal Budget
2D Interconnections in ICs
Integration into 2D Packaging
Flex Circuits
Large Area Power Distribution
Integration into 3D Structures
Electromagnetic Considerations
Power Electronics
Table of Contents provided by Publisher. All Rights Reserved.

ISBN: 9781402077050
ISBN-10: 140207705X
Audience: General
Format: Hardcover
Language: English
Number Of Pages: 158
Published: 30th November 2003
Publisher: Springer-Verlag New York Inc.
Country of Publication: US
Dimensions (cm): 24.08 x 16.31  x 1.52
Weight (kg): 0.43

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