
Testability Concepts for Digital ICs
The Macro Test Approach
By: Frans Beenker, Roger Bennetts, A.P. Thijssen
Paperback | 4 October 2012
At a Glance
Paperback
$249.00
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ISBN: 9781461360049
ISBN-10: 1461360048
Series: Frontiers in Electronic Testing
Published: 4th October 2012
Format: Paperback
Language: English
Number of Pages: 228
Audience: Professional and Scholarly
Publisher: Springer Nature B.V.
Country of Publication: US
Dimensions (cm): 23.39 x 15.6 x 1.22
Weight (kg): 0.33
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