Test and Diagnosis for Small-Delay Defects

By: Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty

Write A Review

Hardcover | 10 September 2011

At a Glance

Hardcover
232 Pages

Dimensions(cm)
23.5 x 15.88 x 1.27

Hardcover

$229.90

or 4 interest-free payments of $57.48 with

or

Ships in 5 to 7 business days

This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.

Shipping

	Standard Shipping	Express Shipping
Metro postcodes:	$9.99	$14.95
Regional postcodes:	$9.99	$14.95
Rural postcodes:	$9.99	$14.95

Orders over $89.00 qualify for free shipping.

How to return your order

At Booktopia, we offer hassle-free returns in accordance with our returns policy. If you wish to return an item, please get in touch with Booktopia Customer Care.

Additional postage charges may be applicable.