| Preface | p. v |
| About the Authors | p. xi |
| Introduction | p. 1 |
| Background | p. 1 |
| General Description of the SEE Mechanism | p. 4 |
| Overview of Quantitative Evaluation Methods | p. 7 |
| Terrestrial Neutron Spectrometry and Dosimetry | p. 11 |
| Introduction | p. 11 |
| Neutron Detection Method | p. 13 |
| Multi-moderator spectrometer (Bonner Ball, Bonner sphere) | p. 13 |
| Organic liquid scintillation spectrometer | p. 17 |
| Dose equivalent counter (rem counter) | p. 21 |
| Phoswich-type detector | p. 26 |
| Experimental Procedure | p. 33 |
| Sequential neutron measurements on the ground at sea level | p. 33 |
| Neutron measurements aboard an airplane and at mountain level | p. 40 |
| Data analysis | p. 48 |
| Results and Discussions | p. 51 |
| Atmospheric pressure effect | p. 51 |
| Neutron energy spectra | p. 53 |
| Time-sequential results of neutron ambient dose equivalent rates | p. 65 |
| Average values of neutron flux and ambient dose equivalent | p. 69 |
| Variation with latitude, altitude and solar activity | p. 73 |
| Calculation of the cosmic-ray neutron spectrum | p. 83 |
| Concluding Remarks | p. 90 |
| Irradiation Testing in the Terrestrial Field | p. 93 |
| What Does Real-Time SER Mean? | p. 93 |
| Statistics and FIT Estimation Methodology | p. 95 |
| Confidence level | p. 96 |
| SER FIT rate calculation (example) | p. 97 |
| Overview of the Real-Time SER Evaluation System for Memory Devices | p. 98 |
| Overview of the memory devices | p. 99 |
| General description of a Real-Time SER evaluation system | p. 103 |
| Environmental Conditions of Real-Time SER Testing | p. 105 |
| Spatial and temporal variation of the terrestrial neutron energy spectrum and dose | p. 105 |
| Geomagnetic latitude, longitude and altitude of Real-Time SER tests | p. 106 |
| Day-, night-time and monthly variation of neutron dose at ground level | p. 110 |
| Monitoring of neutron dose during Real-Time SER testing | p. 114 |
| Real-Time SER Pre-test Preparations | p. 116 |
| Sample selection | p. 116 |
| DUT preparation and orientation | p. 117 |
| Test program verification | p. 117 |
| Effective neutron flux at the test location | p. 118 |
| Test locations of Real-Time SER testing | p. 118 |
| The Impact of Noise on Real-Time SER and Neutron Dose Rate: An Example of Field-testing | p. 120 |
| Concrete attenuation length | p. 121 |
| Verification of the altitude dependence at field-testing | p. 122 |
| Correlation between neutron dose rate and neutron-induced soft error in the field | p. 124 |
| Neutron dose equivalent rate in the environment | p. 124 |
| Comparison of MCU ratio between RTSER and neutron-induced SER | p. 129 |
| Analysis of MCU and anomalous noise results from SER testing at the USA test sites | p. 131 |
| Relation between the influence of solar wind and the change in neutron dose rate | p. 132 |
| Verification of proper operation of the rem counter after the SER test | p. 134 |
| Summary | p. 134 |
| Neutron Irradiation Test Facilities | p. 139 |
| Overview of Neutron Sources used in Neutron Irradiation Test Facilities | p. 139 |
| Monoenergetic Neutron Source below 20 MeV | p. 141 |
| 14 MeV neutron source | p. 143 |
| Variable energy sources; Fast Neutron Laboratory (FNL), Tohoku University | p. 143 |
| Variable energy source at the National Physics Laboratory (NPL) | p. 150 |
| Quasi-monoenergetic Source above 20 MeV | p. 151 |
| [superscript 7]Li(p,n) and [superscript 9]Be(p,n) neutron sources | p. 151 |
| Neutron spectrum and intensity of the [superscript 7]Li(p,n) source | p. 154 |
| Utilization of [superscript 7]Li(p,n) sources for SEU experiments | p. 158 |
| Experimental tail correction method | p. 165 |
| Spallation Neutron Facilities | p. 167 |
| Overview of spallation sources | p. 167 |
| LANSCE (Los Alamos Neutron Science Center), LANL, New Mexico, USA | p. 168 |
| TRIUMF (TRI-University Meson Facility), Vancouver, BC, Canada | p. 171 |
| PCNP (Research Center for Nuclear Physics), Osaka University, Japan | p. 172 |
| Comparison of the neutron flux at various spallation neutron sources | p. 173 |
| Summary | p. 174 |
| Review and Discussion of Experimental Data | p. 175 |
| Monoenergetic Neutron Tests and SEU Excitation Function | p. 175 |
| SEU cross sections in the literature | p. 176 |
| Irradiation test for SEU susceptibility using a mono-and a quasi-monoenergetic neutron source | p. 179 |
| Measurement of the threshold energy for SEU and its importance | p. 191 |
| Application of SEU Excitation Functions | p. 196 |
| Spallation neutron irradiation tests and the unfolding method | p. 196 |
| Experiments using the spallation neutron beams at LANSCE | p. 198 |
| Validation of the SER estimation method using monoenergetic and quasi-monoenergetic neutron beams | p. 201 |
| Derivation of SEU function from spallation neutron tests | p. 203 |
| A framework on our SER evaluation system - SECIS | p. 207 |
| Analysis of Multi-Cell Upsets (MCUs) | p. 209 |
| MCU ratio and its neutron peak-energy dependence | p. 209 |
| MCU ratio and frequency distribution function of MCU | p. 212 |
| Summary | p. 217 |
| Monte Carlo Simulation Methods | p. 219 |
| Nuclear Reaction Model | p. 219 |
| The Device Model | p. 223 |
| The single bit model and basic charge collection mechanism | p. 223 |
| The MCU model | p. 224 |
| Dynamic cell-shift method to simulate an infinite cell matrix | p. 225 |
| The method to implement data pattern into cell matrix | p. 225 |
| The method to implement bit patterns in a word | p. 226 |
| Numerical Data for SER Simulations | p. 227 |
| Materials in silicon semiconductors | p. 227 |
| Elements in silicon semiconductors | p. 228 |
| Total cross section | p. 228 |
| Non-elastic reaction cross section | p. 230 |
| Inverse binary reaction cross section | p. 231 |
| LET calculation for a composite material | p. 232 |
| A Virtual Composite Model | p. 234 |
| Simulation Results and Their Implications | p. 237 |
| Validation of the Model | p. 237 |
| Nuclear reaction model | p. 237 |
| Accelerator test results | p. 237 |
| Field test results | p. 240 |
| Impact of Scaling | p. 240 |
| Asymmetry in Multi-Cell Errors | p. 244 |
| Dispersed and nearest neighbor MCUs | p. 244 |
| MBU sensitive to architecture | p. 246 |
| The margin-of-interleave technique to suppress MBUs | p. 247 |
| Material Effects | p. 248 |
| Secondary ions from different materials | p. 249 |
| Results from a virtual composite material device | p. 249 |
| Threshold Energy of SEU Excitation Function | p. 251 |
| International Standardization of the Neutron Test Method | p. 253 |
| The Current Status of Standardization | p. 253 |
| Monoenergetic Proton Method | p. 254 |
| (Quasi-) Monoenergetic Neutron Method | p. 254 |
| Spallation Neutron Method | p. 256 |
| Summary and Challenges | p. 259 |
| Standard Test Method for Multi-Cell Upset | p. 259 |
| Neutron-Induced Errors in Logic Devices | p. 259 |
| In-depth Study on Material Effects | p. 261 |
| Possible Feedbacks from the System Side | p. 262 |
| Countermeasures in Multiple Hierarchies | p. 262 |
| Countermeasures at the process/device level | p. 263 |
| Countermeasures at the component level | p. 264 |
| Countermeasures at the system level | p. 266 |
| Interdisciplinary Co-operation Necessary for the Next Step of Challenges | p. 267 |
| Appendices | p. 269 |
| Radiological Protection Quantities | p. 269 |
| Approximation Functions for Total Cross Section | p. 273 |
| Approximation Functions for Non-elastic Cross Section | p. 278 |
| Comparison of GEM Calculation Results for Inverse Reaction Cross Section with Literature Data | p. 283 |
| LET Approximation Results in Substrate Used for Silicon Devices | p. 286 |
| Coefficients for LET Calculation for Substrate Used in Silicon Devices | p. 289 |
| References | p. 291 |
| Terms and Definitions | p. 317 |
| Index | p. 335 |
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