System-Level Validation

High-Level Modeling and Directed Test Generation Techniques

By: Mingsong Chen, Xiaoke Qin, Heon-Mo Koo

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Hardcover | 19 September 2012

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Hardcover
272 Pages

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22.86 x 15.88 x 1.91

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This book covers state-of-the art techniques for high-level modeling and validation of complex hardware/software systems, including those with multicore architectures. Readers will learn to avoid time-consuming and error-prone validation from the comprehensive coverage of system-level validation, including high-level modeling of designs and faults, automated generation of directed tests, and efficient validation methodology using directed tests and assertions. The methodologies described in this book will help designers to improve the quality of their validation, performing as much validation as possible in the early stages of the design, while reducing the overall validation effort and cost.

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Non-Fiction Engineering & Technology Electronics & Communications Engineering Electronics Engineering Circuits & Components Computing & I.T.Computer Science Computer Architecture & Logic Design

Introduction	p. 1
Growing SoC Validation Complexity	p. 1
System-Level Validation: Opportunities and Challenges	p. 3
Top-Down Design and Validation Flow	p. 4
SoC Validation Approaches	p. 6
Opportunities in System-Level Validation	p. 10
System-Level Validation Challenges	p. 12
A Comprehensive Approach for System-Level Validation	p. 14
Book Organization	p. 14
References	p. 15
Modeling and Specification of SoC Designs	p. 19
Introduction	p. 19
Modeling of Complex Systems	p. 19
Graph-Based Modeling	p. 20
FSM-Based Behavior Modeling	p. 20
Specification Using SystemC TLMs	p. 22
Modeling of SystemC TLM Designs	p. 22
Transformation from SystemC TLM to SMV	p. 24
Case Study: A Router Example	p. 28
Specification Using UML Activity Diagrams	p. 29
Graphic Notations	p. 30
Formal Modeling of UML Activity Diagrams	p. 32
Transformation from UML Activity Diagrams to SMV	p. 36
Case Study: A Stock Exchange System	p. 40
Chapter Summary	p. 40
References	p. 40
Automated Generation of Directed Tests	p. 43
Introduction	p. 43
Related Work	p. 44
The Workflow of Model Checking Based Test Generation	p. 45
Coverage-Driven Property Generation	p. 46
Safety Property and Its Negation	p. 46
Testing Adequacy Using Model Checking	p. 48
Fault Models	p. 48
Functional Coverage Based on Fault Models	p. 51
Test Generation Using Model Checking Techniques	p. 51
Test Generation Using Unbounded Model Checking	p. 51
Test Generation Using Bounded Model Checking	p. 52
Case Studies	p. 54
A Control System	p. 55
A Stock Exchange System	p. 56
Chapter Summary	p. 57
References	p. 58
Functional Test Compaction	p. 61
Introduction	p. 61
Manufacturing Test Reduction Techniques	p. 61
Test Compression	p. 63
Test Compaction	p. 63
Applicability and Limitations	p. 65
Functional Test Compaction	p. 67
Binary Format of FSM Models	p. 68
Number of FSM States and Transitions	p. 70
Property Compaction of FSM States and Transitions	p. 71
FSM Coverage-Driven Test Selection and Generation	p. 73
A Case Study	p. 74
Chapter Summary	p. 76
References	p. 76
Property Clustering and Learning Techniques	p. 79
Introduction	p. 79
Related Work	p. 80
Background: SAT Solver Implementation	p. 81
DPLL Algorithm	p. 81
Conflict Clause	p. 82
Property Clustering	p. 84
Similarity Based on Structural Overlap	p. 85
Similarity Based on Textual Overlap	p. 86
Similarity Based on Influence	p. 87
Similarity Based on CNF Intersection	p. 88
Determination of Base Property	p. 88
Conflict Clause Based Test Generation	p. 89
Conflict Clause Forwarding Techniques	p. 89
Name Substitution for Computation of Intersections	p. 91
Identification and Reuse of Common Conflict Clauses	p. 92
Case Studies	p. 93
A MIPS Processor	p. 94
A Stock Exchange System	p. 102
Chapter Summary	p. 104
References	p. 105
Decision Ordering Based Learning Techniques	p. 107
Introduction	p. 107
Related Work	p. 108
Decision Ordering Based Learnings	p. 108
Motivation	p. 109
Bit Value Ordering	p. 110
Variable Ordering	p. 111
Hybrid Learning from Conflict Clauses and Decision Ordering	p. 112
Test Generation Using Decision Ordering Techniques	p. 113
Test Generation for a Single Property	p. 114
Test Generation for Similar Properties	p. 116
Case Studies	p. 119
Intra-Property Learning	p. 119
Inter-Property Learning	p. 123
Chapter Summary	p. 127
References	p. 127
Synchronized Generation of Directed Tests	p. 129
Introduction	p. 129
Related Work	p. 130
Synchronized Test Generation	p. 130
Correctness of STG	p. 135
Implementation Details	p. 136
Case Studies	p. 137
A Stock Exchange System	p. 137
A MIPS Processor	p. 140
Chapter Summary	p. 142
References	p. 142
Test Generation Using Design and Property Decompositions	p. 145
Introduction	p. 145
Related Work	p. 147
Decomposition of Design and Property	p. 148
Design Decomposition	p. 149
Property Decomposition	p. 150
Decompositional Test Generation	p. 155
Test Generation Using Module-Level Partitioning	p. 158
Test Generation Using Path-Level Partitioning	p. 160
Merging Partial Counterexamples	p. 161
A Case Study	p. 162
Module-Level Decomposition	p. 163
Group-Level Decomposition Based on Time Step	p. 164
Discussion: Applicability and Limitations	p. 166
Chapter Summary	p. 166
References	p. 166
Learning-Oriented Property Decomposition Approaches	p. 169
Introduction	p. 169
Related Work	p. 170
Learning-Oriented Property Decomposition	p. 171
Spatial Property Decomposition	p. 171
Temporal Property Decomposition	p. 174
Decision Ordering Based Learning Techniques	p. 176
Test Generation Using Decomposition and Learning Techniques	p. 178
An Illustrative Example	p. 179
Spatial Decomposition	p. 179
Temporal Decomposition	p. 180
Case Studies	p. 181
A MIPS Processor	p. 181
A Stock Exchange System	p. 182
Chapter Summary	p. 183
References	p. 184
Directed Test Generation for Multicore Architectures	p. 185
Introduction	p. 185
Related Work	p. 186
Test Generation for Multicore Architectures	p. 187
Correctness of TGMA	p. 191
Implementation Details	p. 193
Heterogeneous Multicore Architectures	p. 194
Case Studies	p. 195
Experimental Setup	p. 195
Results	p. 196
Chapter Summary	p. 199
References	p. 199
Test Generation for Cache Coherence Validation	p. 201
Introduction	p. 201
Related Work	p. 202
Background and Motivation	p. 203
Test Generation for Transition Coverage	p. 204
SI Protocol	p. 205
MSI Protocol	p. 206
MESI Protocol	p. 208
MOSI Protocol	p. 209
Case Studies	p. 210
Chapter Summary	p. 213
References	p. 213
Reuse of System-Level Validation Efforts	p. 215
Introduction	p. 215
Related Work	p. 216
RTL Test Generation from TLM Specifications	p. 217
Automatic TLM Test Generation	p. 217
Translation from TLM Tests to RTL Tests	p. 219
A Prototype Tool for TLM-to-RTL Validation Refinement	p. 222
Case Studies	p. 224
A Router Example	p. 224
A Pipelined Processor Example	p. 228
Chapter Summary	p. 233
References	p. 233
Conclusions	p. 235
Summary	p. 235
Future Directions	p. 237
Appendix A: Acknowledgments of Copyrighted Materials	p. 239
Index	p. 243
Table of Contents provided by Ingram. All Rights Reserved.

System-Level Validation

High-Level Modeling and Directed Test Generation Techniques

At a Glance

Hardcover

Shipping

How to return your order

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You Can Find This Book In

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