1 Introduction
1.1 How do we Define the Surface?
1.2 How Many Atoms in a Surface?
1.3 Information Required
1.4 Surface Sensitivity
1.5 Radiation Effects â" Surface Damage
1.6 Complexity of the Data
2 Electron Spectroscopy for Chemical Analysis
2.1 Overview
2.2 X-ray Interaction with Matter, the Photoelectron Effect and Photoemission from Solids
2.3 Binding Energy and the Chemical Shift
2.4 Inelastic Mean Free Path and Sampling Depth
2.5 Quantification
2.6 Spectral Features
2.7 Instrumentation
2.8 Spectral Quality
2.9 Depth Profiling
2.10 Xâ"Y Mapping and Imaging
2.11 Chemical Derivatization
2.12 Valence Band
2.13 Perspectives
2.14 Conclusions Acknowledgements References Problems
3 Molecular Surface Mass Spectrometry by SIMS
3.1 Introduction
3.2 Basic Concepts
3.3 Experimental Requirements
3.4 Secondary Ion Formation
3.5 Modes of Analysis
3.6 Ionization of the Sputtered Neutrals
3.7 Ambient Methods of Desorption Mass Spectrometry References
Problems
4 Secondary Ion Mass Spectrometry â" Depth Profiling Theory and Applications [NEW]
5 Mass Spectrometry Imaging by MALDI and Ambient Methods [NEW]
6 Low-Energy Ion Scattering and Rutherford Backscattering
6.1 Introduction
6.2 Physical Basis
6.3 Rutherford Backscattering
6.4 Low-Energy Ion Scattering Acknowledgement
References Problems Key Facts
7 Vibrational Spectroscopy from Surfaces
7.1 Introduction
7.2 Infrared Spectroscopy from Surfaces
7.3 Electron Energy Loss Spectroscopy (EELS)
7.4 The Group Theory of Surface Vibrations
7.5 Laser Raman Spectroscopy from Surfaces
7.6 Inelastic Neutron Scattering (INS)
7.7 Sum-Frequency Generation Methods References
Problems
8 Surface Structure Determination by Interference Techniques
8.1 Introduction
8.2 Electron Diffraction Techniques
8.3 X-ray Techniques
8.4 Photoelectron Diffraction References
9 Scanning Probe Microscopy
9.1 Introduction
9.2 Scanning Tunnelling Microscopy
9.3 Atomic Force Microscopy
9.4 Scanning Near-Field Optical Microscopy
9.5 Other Scanning Probe Microscopy Techniques
9.6 Lithography Using Probe Microscopy Methods
9.7 Conclusions References Problems
10 The Application of Multivariate Data Analysis Techniques in Surface Analysis
10.1 Introduction
10.2 Basic Concepts
10.3 Factor Analysis for Identification
10.4 Regression Methods for Quantification10.5 Methods for Classification
10.6 Summary and Conclusion Acknowledgements References
Problems
Appendix 1 Vacuum Technology for Applied Surface Science
A1.1 Introduction: Gases and Vapours
A1.2 The Pressure Regions of Vacuum Technology and their Characteristics
A1.3 Production of a Vacuum
A1.4 Measurement of Low Pressures Acknowledgement
References
Appendix 2 Units, Fundamental Physical Constants and Conversions
A2.1 Base Units of the SI
A2.2 Fundamental Physical Constants A2.3 Other Units and Conversions to SI References
Index
