Springerbriefs in Applied Sciences and Technology

New Perspectives for Materials Characterization

By: Nicolas Brodusch, Hendrix Demers, Raynald Gauvin

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Paperback | 6 October 2017

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Paperback
152 Pages

Dimensions(cm)
23.5 x 15.49 x 0.84

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This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage

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