Springer Photonics

By: Jungsang Kim, Seema Somani, Yoshihisa Yamamoto

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Hardcover | 28 August 2001

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260 Pages

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24.13 x 18.42 x 1.91

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The quantum statistical properties of the light wave generated in a semiconductor laser or a light-emitting diode (LED) has been a field of intense research for more than a decade. This research monograph discusses recent research activities in nonclassical light generation based on semiconductor devices. This volume is composed of four major parts. The first discusses the generation of sub-shot-noise light in macroscopic pn junction light-emitting devices, including semiconductor laser and light-emitting diodes. The second part discusses the application of squeezed light in high-precision measurement, including spectroscopy and interferometry. The third part addresses the Coulomb blockade effect in a mesoscopic pn junction and the generation of single photon states. The last part covers the detection of single photons using a visible light photon counter.

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Non-Fiction Science Physics Optical Physics Engineering & Technology Electronics & Communications Engineering Electronics Engineering Electronic Devices & Materials Semi-Conductors & Super-Conductors Other Technologies & Applied Sciences Applied Optics Laser Technology & Holography

Medicine Medicine in General Classical Mathematics Wave Mechanics including Vibration & Acoustics Energy Technology & Engineering Electrical Engineering Communications Engineering & Telecommunications

Nonclassical Light	p. 1
Classical Description of Light	p. 1
Quantum Description of Light	p. 2
Coherent State, Squeezed State and Number-Phase Squeezed State	p. 3
Quantum Theory of Photodetection and Sub-Poisson Photon Distribution	p. 4
Quantum Theory of Second-Order Coherence and Photon Antibunching	p. 6
Quantum Theory of Photocurrent Fluctuation and Squeezing	p. 9
Noise of p-n Junction Light Emitters	p. 13
Introduction	p. 13
Junction Voltage Dynamics: the Poisson Equation	p. 14
Semiclassical Langevin Equation for Junction Voltage Dynamics	p. 17
Mesoscopic Case (r ≫ 1)	p. 18
Macroscopic Case (r ≪ 1)	p. 18
Noise Analysis of an LED	p. 20
Steady-State Conditions	p. 22
Linearization	p. 22
Photon-Number Noise	p. 23
Noise in the External Circuit Current	p. 27
Correlation Between Carrier Number and Junction Voltage	p. 28
Correlation Between Photon Flux and Junction Voltage	p. 29
Summary	p. 30
Sub-Poissonian Light Generation in Light-Emitting Diodes	p. 31
Introduction	p. 31
Physical Mechanism of Pump-Noise Suppression	p. 31
Measurement of the Squeezing Bandwidth	p. 33
Summary	p. 39
Amplitude-Squeezed Light Generation in Semiconductor Lasers	p. 41
Introduction	p. 41
Interferometric Measurement of Longitudinal-Mode-Partition Noise	p. 43
Principle	p. 43
Experimental Setup	p. 43
Grating-Feedback External-Cavity Semiconductor Laser	p. 45
Experimental Setup and Procedure	p. 45
Experimental Results	p. 45
Discussion	p. 48
Injection-Locked Semiconductor Laser	p. 48
Experimental Setup and Procedure	p. 48
Experimental Results	p. 49
Discussion	p. 51
Modeling of the Noise of an Injection-Locked Laser	p. 52
Summary	p. 55
Excess Intensity Noise of a Semiconductor Laser with Nonlinear Gain and Loss	p. 57
Introduction	p. 57
Physical Models for Nonlinearity	p. 58
Nonlinear Gain	p. 58
Nonlinear Loss	p. 60
Noise Analysis Using Langevin Rate Equations	p. 61
Numerical Results	p. 63
Numerical Parameters	p. 63
Results	p. 63
Discussion: Effect of Saturable Loss	p. 65
Comparison of Two Laser Structures with Respect to Saturable Loss	p. 69
Estimate of the Loss by Si DX Centers	p. 69
Experimental Verification of the Saturable Loss	p. 71
Explanation for the Excess Noise in QW Lasers	p. 74
Summary	p. 74
Transverse-Junction-Stripe Lasers for Squeezed Light Generation	p. 77
Introduction	p. 77
Fabrication	p. 78
Si Diffusion and Intermixing	p. 78
High V/III Ratio for Sharper Interfaces	p. 79
P Doping by Zn Diffusion	p. 79
Devices	p. 80
DC Characterization: Threshold, Loss and Quantum Efficiency	p. 80
Intensity Noise	p. 81
Influence of High V/III Ratio	p. 81
Optimization of External Coupling Efficiency	p. 83
Polarization-Partition Noise	p. 84
Longitudinal-Mode-Partition Noise	p. 85
Suppressed 1/f Noise	p. 86
Summary	p. 87
Sub-Shot-Noise FM Spectroscopy	p. 89
Introduction	p. 89
Advantages of Semiconductor Lasers	p. 89
Signal to Noise Ratio (SNR)	p. 90
Realization of Sub-Shot-Noise FM Spectroscopy	p. 92
Frequency and Noise Control by Injection Locking	p. 93
Effect of Injection Locking on Intensity Noise	p. 95
Suppression of Residual AM by Injection-Locking	p. 96
Suppression of Residual AM by Dual Pump Current Modulation	p. 98
Expected Lineshape	p. 101
Spectroscopic Setup	p. 103
Experimental Results	p. 104
Future Prospects	p. 105
Sub-Shot-Noise FM Noise Spectroscopy	p. 107
Introduction	p. 107
Principle of FM Noise Spectroscopy	p. 109
Signal-to-Noise Ratio and the Advantage of Amplitude Squeezing	p. 109
Sub-Shot-Noise Spectroscopy	p. 110
Experimental Setup	p. 110
Laser Trapping and Cooling of Rb	p. 111
Expected Optical Transitions in a Magneto-Optic Trap	p. 112
Sample Probing	p. 113
Experimental Result	p. 114
Phase-Sensitive FM Noise Spectroscopy	p. 116
Experimental Setup	p. 116
Experimental Results	p. 118
Summary	p. 121
Sub-Shot-Noise Interferometry	p. 123
Introduction	p. 123
Sensitivity Limit of an Optical Interferometer	p. 124
Amplitude-Squeezed Light Injection in a Dual-Input Mach-Zehnder Interferometer	p. 125
Sub-Shot-Noise Phase Measurement	p. 127
Experimental Procedure	p. 127
Experimental Result	p. 128
Dual-Input Michelson Interferometer	p. 131
Operation Principle	p. 131
Sensitivity of a Dual-Input Michelson Interferometer	p. 133
Sub-Shot-Noise Interferometry	p. 134
Summary and Future Prospects	p. 136
Coulomb Blockade Effect in Mesoscopic p-n Junctions	p. 137
Introduction	p. 137
Calculation of Resonant Tunneling Rates	p. 138
Transmittance of the Barrier	p. 139
Tunneling Matrix Element	p. 140
Electron Tunneling Current Density into the Central QW	p. 142
Effect of Inhomogeneous Broadening	p. 143
Coulomb Blockade Effect on Resonant Tunneling	p. 144
Coulomb Staircase	p. 146
DC Voltage Bias Condition	p. 146
DC + AC Voltage Bias Condition	p. 148
Turnstile Operation	p. 150
Monte-Carlo Simulations	p. 154
Summary	p. 154
Single-Photon Generation in a Single-Photon Turnstile Device	p. 155
Introduction	p. 155
Device Fabrication	p. 155
Wafer Design and Growth	p. 156
Ohmic Contact Formation	p. 157
Device Definition: Electron-Beam Lithography	p. 158
Metal Evaporation and Liftoff	p. 158
Device Isolation: ECR-RIE	p. 160
Surface Passivation	p. 162
Planarization and Top-Contact Evaporation	p. 165
Observation of the Coulomb Staircase	p. 167
Single-Photon Turnstile Device	p. 168
Preliminary Characterization	p. 168
Experimental Setup	p. 170
Electrical Characterization	p. 172
Optical Characterization	p. 174
Summary	p. 177
Single-Photon Detection with Visible-Light Photon Counter	p. 179
Introduction	p. 179
Comparison of Single-Photon Detectors	p. 180
Photomultiplier Tubes (PMTs)	p. 180
Avalanche Photodiodes (APDs)	p. 181
Superconducting Tunnel Junctions (STJs)	p. 182
Solid-State Photomultipliers (SSPMs) and Visible-Light Photon Counters (VLPCs)	p. 183
Operation Principle of a VLPC	p. 183
Single-Photon Detection System Based on a VLPC	p. 184
Quantum Efficiency of a VLPC	p. 186
Theory of Noise in Avalanche Multiplication	p. 191
Excess Noise Factor (ENF)	p. 191
Noise Power Spectral Density of the Multiplied Photocurrent	p. 192
Effect of ENF in the Pulse-Height Distribution	p. 193
Excess Noise Factor of a VLPC	p. 194
Digital Measurement of the Pulse-Height Distribution	p. 195
Analog Noise Power Spectral Density Measurement	p. 196
Two-Photon Detection with a VLPC	p. 198
Twin Photon Generation in Optical Parametric Downconversion	p. 199
Characterization of Two-Photon Detection with VLPC	p. 201
Summary	p. 204
Future Prospects	p. 207
Introduction	p. 207
Regulated and Entangled Photons from a Single Quantum Dot	p. 208
Single-Mode Spontaneous Emission from a Single Quantum Dot in a Three-Dimensional Microcavity	p. 212
Lasing and Squeezing of Exciton-Polaritons in a Semiconductor Microcavity	p. 217
Appendix: Noise and Correlation Spectra for Light-Emitting Diode	p. 221
Linearization	p. 221
LED Photon Noise Spectral Density	p. 222
External Current Noise Spectral Density	p. 223
Junction-Voltage-Carrier-Number Correlation	p. 223
Photon-Flux-Junction-Voltage Correlation	p. 224
References	p. 225
Subject Index	p. 241
Table of Contents provided by Publisher. All Rights Reserved.

Springer Photonics

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