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Springer Materials Science : Springer Series in Materials Science - C. Claeys

Springer Materials Science

By: C. Claeys, Eddy Simoen

Paperback | 1 December 2010

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This wide-ranging book summarizes the current knowledge of radiation defects in semiconductors, outlining the shortcomings of present experimental and modelling techniques and giving an outlook on future developments. It also provides information on the application of sensors in nuclear power plants.

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