Springer Advanced Microelectronics

Basics and Use for Evaluating Electronic Devices and Materials

By: Martin C. Schubert, Wilhelm Warta, Otwin Breitenstein

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Hardcover | 22 January 2019 | Edition Number 3

At a Glance

Hardcover
344 Pages

Edition Type
Revised

Dimensions(cm)
23.5 x 15.5 x 2.06

Hardcover

$249.00

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This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included.

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