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Results for author 'Laung-Terng Wang'

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VLSI Test Principles and Architectures : Design for Testability - Laung-Terng Wang

VLSI Test Principles and Architectures

Design for Testability

Laung-Terng Wang, Cheng-Wen Wu and Xiaoging Wen

Hardcover

RRP $140.95

$131.75

Electronic Design Automation : Synthesis, Verification, and Test - Laung Terng-Wang

Electronic Design Automation

Synthesis, Verification, and Test

Laung Terng-Wang, Kwang-Ting Cheng and Yao-Wen Chang

Hardcover

RRP $171.95

$157.75

System-on-Chip Test Architectures : Nanometer Design for Testability - Nur Touba

System-on-Chip Test Architectures

Nanometer Design for Testability

Nur Touba, Charles Stroud and Laung-Terng Wang

Hardcover

RRP $132.95

$124.75

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