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System-on-Chip Test Architectures : Nanometer Design for Testability - Nur Touba

System-on-Chip Test Architectures

Nanometer Design for Testability

Nur Touba, Charles Stroud and Laung-Terng Wang

Hardcover

RRP $132.95

$124.75

A Designer's Guide to Built-In Self-Test : Frontiers in Electronic Testing - Charles E. Stroud

A Designer's Guide to Built-In Self-Test

Frontiers in Electronic Testing

Charles E. Stroud

Paperback

$329.75

A Designer's Guide to Built-In Self-Test : Frontiers in Electronic Testing - Charles E. Stroud

A Designer's Guide to Built-In Self-Test

Frontiers in Electronic Testing

Charles E. Stroud

Hardcover

$329.75

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