Free shipping on all orders over $79* Limited Time Only
Track My Order
Help Centre
Likes
My Wish ListsLogin / Join
Booktopia
Australia's local bookstore
Get Free Shipping on orders over $79
Reflection Electron Microscopy and Spectroscopy for Surface Analysis - No Information Available

Reflection Electron Microscopy and Spectroscopy for Surface Analysis

By: No Information Available

Paperback | 25 August 2005

At a Glance

Paperback

RRP $99.95

$89.75

10%OFF

or 4 interest-free payments of $22.44 with

 or 

Ships in 5 to 7 business days

This book is a comprehensive review of the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS). The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy-loss spectra in different scattering geometries. This and many other features makes the book an important and timely addition to the materials science literature for researchers and graduate students in physics and materials science.
Industry Reviews
'A very complete review of all work performed in reflection electron microscopy with an exhaustive bibliography ... It forms an exciting support for the understanding of surface studies by reflection electron microscopy. Illustrated by many beautiful and pertinent REM images and well-designed line drawings, this book should certainly be useful for graduate students and scientists working on surface characterization.' Andre Rocher, Measurement Science & Technology 'For those with a TEM background it represents, perhaps, the definitive text for reflection methods ... extremely readable ... attractive style ... Dr. Wang is to be congratulated on writing a very accesible text. The book is thoroughly recommended.' John F. Watts, The Analyst ' ... a very pleasing volume which should attract new users to these techniques.' P. W. Hawkes, Ultramicroscopy ' ... this book provides a comprehensive review of theory, techniques and applications of reflection electron microscopy.' Aslib Book Guide

You Can Find This Book In

Non-FictionScienceScience in GeneralScientific EquipmentMicroscopyPhysicsEngineering & TechnologyMechanical Engineering & MaterialsMaterials Science

Other Editions and Formats

Hardcover

Published: 22nd July 1996

View Product

More in Materials Science

Mechanics of Materials, SI Edition : 11th Edition - Russell Hibbeler

Mechanics of Materials, SI Edition

11th Edition

Paperback

RRP $127.00

$92.99

27%
OFF
Metal oxide-based thermoelectric materials : Metal Oxides - Jai Singh

Metal oxide-based thermoelectric materials

Metal Oxides

Paperback

RRP $500.95

$440.75

12%
OFF
Material World : A Substantial Story of Our Past and Future - Ed Conway

Material World

A Substantial Story of Our Past and Future

Paperback

RRP $26.99

$22.99

15%
OFF
Structure and Properties of Alloys - Lilly Armstrong

Structure and Properties of Alloys

Hardcover

$408.75

Handbook of Semiconductor Technology - Bill Fraley

Handbook of Semiconductor Technology

Hardcover

$424.75

Fundamentals of Fiber Orientation - James Thatcher

Fundamentals of Fiber Orientation

Hardcover

$387.75

Materials : Corrosion and Protection - Robert Duckie

Materials

Corrosion and Protection

Hardcover

$437.75

This product is categorised by