Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization

By: Chandra Shakher Pathak (Editor), Samir Kumar (Editor)

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Hardcover | 7 January 2022

At a Glance

Hardcover
274 Pages

Dimensions(cm)
26.0 x 18.0 x 1.75

Hardcover

$332.75

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This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.

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