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Proceedings : Thirteenth IEEE European Test Symposium: Ets 2008, 25-29 May 2008, Verbania, Italy - Institute of Electrical and Electronics Engineers

Proceedings

Thirteenth IEEE European Test Symposium: Ets 2008, 25-29 May 2008, Verbania, Italy

By: Institute of Electrical and Electronics Engineers  (Compiled by)

Paperback | 1 January 2008

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ISBN: 9780769531502

ISBN-10: 0769531504

Published: 1st January 2008

Format: Paperback

Language: English

Number of Pages: 205

Audience: General Adult

Publisher: IEEE COMPUTER SOC PR

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