Proceedings
Thirteenth IEEE European Test Symposium: Ets 2008, 25-29 May 2008, Verbania, Italy
By: Institute of Electrical and Electronics Engineers (Compiled by)
Paperback | 1 January 2008
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ISBN: 9780769531502
ISBN-10: 0769531504
Published: 1st January 2008
Format: Paperback
Language: English
Number of Pages: 205
Audience: General Adult
Publisher: IEEE COMPUTER SOC PR
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