Oxide Reliability
A Summary Of Silicon Oxide Wearout, Breakdown, And Reliability
By: David J Dumin (Editor)
Hardcover | 28 January 2002
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Hardcover
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ISBN: 9789810248420
ISBN-10: 9810248423
Series: Selected Topics in Electronics and Systems
Published: 28th January 2002
Format: Hardcover
Language: English
Number of Pages: 280
Audience: College, Tertiary and University
Publisher: World Scientific Publishing Co Pte Ltd
Country of Publication: SG
Dimensions (cm): 24.77 x 16.51 x 1.91
Weight (kg): 0.63
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This product is categorised by
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