
Optical Spectroscopy
Methods and Instrumentations
Hardcover | 1 May 2006
At a Glance
322 Pages
24.13 x 17.15 x 1.91
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Recent developments in lasers, optics and electronics has had a significant impact on modern optical spectroscopic methods and instrumentations. Combining the newest lasers, advanced detectors and other high technology components researchers are able to assemble a spectroscopic instrument with characteristics that were hardly achievable a decade ago. This book will help readers to sourse spectroscopy tools to solve their problems by providing information on the most widely used methods while introducing readers to the principles of quantitative analysis of the application range for each methodology. In addition, background information is provided on optics, optical measurements and laser physics, which is of crucial importance for spectroscopic applications.
* provides an overview of the most popular absorption/emission spectroscopy techniques
* discusses application range, advantages and disadvantages are compared for different spectroscopy methods
* provides introductions to the relevant topics such as optics and laser physics
| Preface | p. v |
| Contents | p. ix |
| Introduction | p. 1 |
| Absorption | p. 1 |
| Light absorption in a bulk medium | p. 1 |
| Absorption of complex samples | p. 5 |
| Electronic, vibrational and rotational levels | p. 7 |
| Wavelength, frequency and energy | p. 8 |
| Emission | p. 9 |
| Black body emission | p. 9 |
| Two level system (Einstein's coefficients) | p. 11 |
| Fluorescence and phosphorescence | p. 12 |
| Light amplification | p. 13 |
| Optical spectroscopy | p. 14 |
| Optics and Optical Devices | p. 15 |
| Waves | p. 15 |
| Wave equation | p. 15 |
| Harmonic waves | p. 17 |
| Plane waves | p. 17 |
| Interference | p. 19 |
| Michelson interferometer | p. 20 |
| Fabry-Perot interferometer | p. 22 |
| Interference filters and mirrors | p. 26 |
| Diffraction | p. 27 |
| Fresnel formulation | p. 27 |
| Fraunhofer diffraction (far field approximation) | p. 27 |
| Diffraction grating | p. 29 |
| Monochromator | p. 31 |
| Calculations of optical system (matrix formulation) | p. 33 |
| Geometrical optics approximation | p. 33 |
| Beam transfer matrix | p. 34 |
| Imaging and magnification | p. 35 |
| Lasers for Spectroscopy Applications | p. 39 |
| Laser active medium | p. 39 |
| Laser resonators | p. 41 |
| Resonator with active medium | p. 41 |
| Resonator bandwidth | p. 42 |
| Longitudinal modes | p. 43 |
| Transverse modes | p. 43 |
| Stable and unstable resonators | p. 45 |
| Continuous wave lasers | p. 45 |
| Pulsed lasers | p. 45 |
| Q-Switched lasers | p. 46 |
| Mode-locked lasers | p. 47 |
| Laser amplifiers | p. 48 |
| Main types of lasers | p. 49 |
| Nd:YAG lasers | p. 49 |
| Ion lasers | p. 50 |
| Excimer lasers | p. 50 |
| Dye lasers | p. 51 |
| Ti:sapphire lasers | p. 52 |
| Semiconductor lasers | p. 54 |
| Other lasers used in spectroscopy applications | p. 54 |
| Non-linear optic effect in laser applications | p. 55 |
| Second harmonic | p. 56 |
| Third harmonic | p. 57 |
| Wave mixing | p. 58 |
| Parametric amplification and generation of the light | p. 58 |
| Optical measurements | p. 61 |
| Noise statistics and accuracy of measurements | p. 61 |
| Systematic error and random noise | p. 62 |
| Noise statistics | p. 63 |
| Statistical approach to measurements | p. 69 |
| Noise sources | p. 70 |
| Inaccuracy of indirect measurements | p. 70 |
| Photosensitive devices | p. 72 |
| Photodetector performance parameters | p. 72 |
| Photomultiplier tubes | p. 74 |
| Semiconductor photo-detectors | p. 78 |
| Other photo-detectors | p. 80 |
| Measurements of the light power | p. 80 |
| Measurements of the pulse energy | p. 81 |
| Measurements of the pulse duration | p. 82 |
| Direct methods | p. 82 |
| Autocorrelators (indirect methods) | p. 83 |
| Steady State Absorption Spectroscopy | p. 89 |
| Measurements of the light absorption spectrum | p. 89 |
| Spectrophotometer schemes | p. 91 |
| Single channel scheme | p. 91 |
| Two channel scheme | p. 92 |
| Spectrophotometers with array detectors | p. 95 |
| Main characteristics of spectrophotometers | p. 96 |
| Spectrum range | p. 96 |
| Spectrum resolution | p. 97 |
| Sensitivity and absorption range | p. 98 |
| Instruments, accessories and applications | p. 99 |
| Spectrophotometer specifications | p. 99 |
| Cuvettes for absorption spectroscopy | p. 100 |
| Application notes and examples | p. 102 |
| Steady State Emission Spectroscopy | p. 107 |
| Measurement of the Emission Spectrum | p. 108 |
| Fluorimeter | p. 109 |
| Optical Scheme | p. 109 |
| Use of Array Detectors | p. 111 |
| Evaluation of the Measured Signal | p. 111 |
| Spectrum Correction | p. 113 |
| Quantum yield determination by comparison method | p. 114 |
| Excitation spectrum | p. 115 |
| Sensitivity | p. 117 |
| Wavelength resolution | p. 120 |
| Samples for emission measurements | p. 121 |
| Excitation-monitoring schemes | p. 121 |
| Cuvettes | p. 122 |
| Effect of the sample absorption | p. 122 |
| Fluorimeter specifications | p. 123 |
| Water Raman scattering line as sensitivity test | p. 123 |
| Commercial fluorimeters | p. 124 |
| Emission of molecular monolayer: An example | p. 125 |
| Flash-photolysis | p. 129 |
| Principles | p. 129 |
| Optical scheme | p. 130 |
| Transient absorbance | p. 131 |
| Differential absorption spectra | p. 133 |
| Excitation schemes | p. 135 |
| Excitation | p. 136 |
| Time resolution and signal-to-noise ratio | p. 138 |
| Pulsed monitoring light | p. 141 |
| Signal averaging | p. 142 |
| Spectrum range and spectrum resolution | p. 143 |
| Measurements of emitting samples | p. 143 |
| Effect of scattering and sample emission | p. 143 |
| Applications in time resolved emission spectroscopy | p. 145 |
| Flash-photolysis instruments | p. 145 |
| Commercial instruments and components | p. 145 |
| Flash-photolysis study of an electron transfer: An example | p. 146 |
| Time correlated single photon counting | p. 151 |
| Principles | p. 151 |
| Excitation sources | p. 153 |
| Detection subsystem | p. 156 |
| Emission detectors | p. 156 |
| Electronics | p. 156 |
| Method characteristics | p. 157 |
| Time resolution | p. 157 |
| Peal-up distortions | p. 157 |
| Sensitivity | p. 158 |
| Signal collection time | p. 160 |
| Spectrum range | p. 161 |
| Comparison with direct emission decay measurements | p. 161 |
| Measurements and data analysis | p. 162 |
| Instrument response function and decay deconvolution | p. 162 |
| Time resolved and decay associated spectra | p. 163 |
| Commercial instruments | p. 165 |
| Measurements of single molecule: Application example | p. 166 |
| Frequency domain emission spectroscopy | p. 171 |
| Theoretical background | p. 171 |
| Measurements scheme | p. 174 |
| Frequency domain instruments | p. 175 |
| Light source | p. 176 |
| Detection system | p. 176 |
| Comparison between frequency and time domain methods | p. 176 |
| Picosecond time resolution with streak camera | p. 179 |
| Operation principles | p. 179 |
| Main characteristics | p. 181 |
| Time resolution | p. 181 |
| Spectrum range | p. 182 |
| Sensitivity | p. 182 |
| Advantages and disadvantages | p. 182 |
| Instrument examples | p. 183 |
| Pump-probe | p. 185 |
| Principles | p. 185 |
| Mono-color scheme | p. 185 |
| Two color scheme | p. 188 |
| Measurements of time resolved spectra | p. 190 |
| Samples and sample excitation schemes | p. 193 |
| Laser systems | p. 194 |
| Detection subsystem and sensitivity | p. 200 |
| Time resolution | p. 201 |
| Group velocity dispersion | p. 202 |
| Effects of sample and optics on time resolution | p. 204 |
| Measurements of the delay spectrum | p. 206 |
| Can it be faster? | p. 207 |
| Sensitivity | p. 210 |
| Application example | p. 210 |
| Photo-induced charge transfer in molecular dyad | p. 210 |
| Pump-probe study of thin films | p. 212 |
| Emission spectroscopy with optical gating methods | p. 217 |
| Frequency up-conversion | p. 217 |
| Principles of up-conversion | p. 217 |
| Time resolution | p. 221 |
| Evaluation of the instrument response time | p. 223 |
| Sensitivity | p. 225 |
| Excitation pulse energy | p. 227 |
| Spectrum range | p. 228 |
| Time resolved spectra | p. 229 |
| Commercial instruments and components | p. 231 |
| Optical Kerr effect | p. 231 |
| Photo-dynamics of semiconductor quantum wells | p. 234 |
| Ultra-fine spectrum resolution | p. 237 |
| Natural line width and broadening | p. 237 |
| Traditional optical tools for high spectrum resolution | p. 239 |
| Lasers for fine spectrum resolution | p. 241 |
| Resonator limited bandwidth | p. 241 |
| Amplification bandwidth and lasing threshold | p. 241 |
| Mode-beating and resonator design for single mode lasers | p. 243 |
| High resolution in absorption spectroscopy | p. 244 |
| Laser spectroscopy | p. 244 |
| Intra-cavity spectroscopy | p. 244 |
| High resolution in emission spectroscopy | p. 245 |
| Spectral hole-burning | p. 248 |
| Polarization measurements | p. 249 |
| Light polarization | p. 249 |
| Interaction of polarized light with media | p. 251 |
| Magic angle | p. 252 |
| Induced anisotropy in fluorescence measurements | p. 253 |
| Anisotropy coefficient | p. 255 |
| Applications of polarized measurements | p. 257 |
| Tools for polarized measurements | p. 257 |
| Optical schemes for polarization measurements | p. 258 |
| Measurements of energy transfer dynamics | p. 259 |
| Analysis of the measurements | p. 263 |
| Indirect measurements | p. 263 |
| Spectral data analysis | p. 264 |
| Kinetics and reaction schemes | p. 267 |
| First order reactions | p. 267 |
| Second order reactions | p. 268 |
| Complex schemes for the first order reactions | p. 269 |
| Time resolved measurements | p. 274 |
| Data fitting | p. 277 |
| Criteria for the fit goodness | p. 277 |
| Minimization of mean square deviation | p. 278 |
| Non-linear least square fit | p. 280 |
| Global fitting of time resolved measurements | p. 283 |
| Qualitative problems | p. 284 |
| Final remarks | p. 287 |
| Photon counting peal-up distortions | p. 289 |
| Relation between Gaussian pulse width and its spectrum | p. 291 |
| Two photon absorption | p. 293 |
| Fit algorithms | p. 295 |
| Stepping algorithm | p. 295 |
| Gradient method | p. 296 |
| Newton method | p. 296 |
| Random search | p. 297 |
| Physical properties of some solvents | p. 299 |
| Bibliography | p. 301 |
| Index | p. 304 |
| Table of Contents provided by Ingram. All Rights Reserved. |
ISBN: 9780444521262
ISBN-10: 0444521267
Published: 1st May 2006
Format: Hardcover
Language: English
Number of Pages: 322
Audience: Professional and Scholarly
Publisher: ELSEVIER SCIENCE & TECHNOLOGY
Country of Publication: GB
Dimensions (cm): 24.13 x 17.15 x 1.91
Weight (kg): 0.72
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