Frontiers in Electronic Testing

By: Michael GÃ¶ssel, Vitaly Ocheretny, Egor Sogomonyan

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Hardcover | 9 May 2008

At a Glance

Hardcover
192 Pages

Dimensions(cm)
24.13 x 15.88 x 1.27

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Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners, hospital patients, inhabitants in the vicinity of a nuclear power station, students in a digital library or customers in a supermarket are dependent on their correct operation. Computers are incredibly fast, inexpensive and equipped with almost unimag- able large storage capacity. Up to 100 million transistors per chip are quite common today - a single transistor for each citizen of a large capital city in the world can be 2 easily accommodated on an ordinary chip. The size of such a chip is less than 1 cm . This is a fantastic achievement for an unbelievably low price. However, the very small and rapidly decreasing dimensions of the transistors and their connections over the years are also the reason for growing problems with reliability that will dramatically increase for the nano-technologies in the near future. Can we always trust computers? Are computers always reliable? Are chips suf- ciently tested with respect to all possible permanent faults if we buy them at a low price or have errors due to undetected permanent faults to be discovered by c- current checking? Besides permanent faults, many temporary or transient faults are also to be expected.

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You Can Find This Book In

Non-Fiction Engineering & Technology Electronics & Communications Engineering Electronics Engineering Circuits & Components Technology in General Engineering in General Reference, Information & Interdisciplinary Subjects Research & Information Information theory Computing & I.T.Graphical & Digital Media Applications

3D Graphics & Modelling Computer Science Computer Architecture & Logic Design Energy Technology & Engineering Electrical Engineering

Introduction	p. 1
Physical Faults and Functional Errors	p. 5
Principles of Concurrent Checking	p. 31
Concurrent Checking for the Adders	p. 123
References	p. 173
Index	p. 179
Table of Contents provided by Blackwell. All Rights Reserved.

Frontiers in Electronic Testing

At a Glance

Hardcover

Shipping

How to return your order

Defective items

You Can Find This Book In

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