| Recent Developments in Instrumentation for X-Ray Microanalysis | p. 1 |
| High Resolution Non Dispersive X-Ray Spectroscopy with State of the Art Silicon Detectors | p. 11 |
| Efficiency Calibration of a Si(Li) Detector by EPMA | p. 21 |
| Wavelength-Dispersive X-Ray Spectrometry | p. 29 |
| X-Ray Spectrum Processing and Multivariate Analysis | p. 37 |
| Thin Film Analysis and Chemical Mapping in the Analytical Electron Microscope | p. 49 |
| On the Spatial Resolution in Analytical Electron Microscopy | p. 59 |
| Contamination in Analytical Electron Microscopy and in ALCHEMI | p. 65 |
| Analytical Electron Microscopy of Diffusional Interfaces in an Al-22 at. % Zn Alloy | p. 73 |
| Quantitative TEM-EDXS of Sol-Gel Derived PZT Ceramic Materials | p. 77 |
| Particulate Composites of TZP-Chromium Oxide and TZP-Chromium Carbide; Microbeam Investigations | p. 83 |
| Cryo-Electron Spectroscopic Imaging, Electron Energy-Loss Spectroscopy and Energy-Dispersive X-Ray Analysis of Ag(Br.I) Nano- and Microcrystals | p. 87 |
| Electron Energy-Loss Near-Edge Structure of Alumina Polymorphs | p. 93 |
| SPM Study of YBCO Films Prepared by Plasma Assisted Laser Ablation | p. 97 |
| Surface Characterisation and Modification of YBCO Thin Films by STM | p. 101 |
| Quantitative Near-Surface Microanalysis and Depth Profiling by EPMA | p. 109 |
| EPMA Sputter Depth Profiling. Part I: Theory and Evaluation | p. 125 |
| EPMA Sputter Depth Profiling. Part II: Experiment | p. 133 |
| Quantitative Analysis of BN (C, O, Ar, H)-Coatings Using EPMA and SIMS | p. 141 |
| Quantitative EDS Analysis of SiO[subscript 2]/Al[subscript 2]O[subscript 3]/TiO[subscript 2] Multilayer Films | p. 149 |
| Surface Ionization of Thin Films on Substrates: Measurement and Simulation | p. 155 |
| Comparison of Different Methods to Characterize Thin a-Si:H Films | p. 163 |
| EPMA Studies of the Growth of Thin Surface Coatings Produced by Evaporation | p. 171 |
| Analysis of Thin Films with Slightly Rough Boundaries | p. 177 |
| Effect of Chromium Substrate Pretreatment on Diamond Growth by the Chemical Vapour Deposition Method | p. 181 |
| EPMA Determination of Arsenic Excess in Low Temperature Grown GaAs | p. 187 |
| EPMA of Melted UO[subscript 2] Fuel Rods from the Phebus-FP Reactor Accident Experiment | p. 191 |
| Steels, Carbon Concentration, and Microhardness | p. 201 |
| Determination of Chemical and Phase Composition of Fly-Ashes by Combined EPMA and XRD Methods | p. 207 |
| EPMA of the Composition of Opal-Based Nanostructured Materials | p. 211 |
| NDIC and EMP Study of Plagioclase Mineral Zoning: An Example from Nea Kameni Lavas | p. 219 |
| Compositional X-Ray Maps of Metamorphic and Magmatic Minerals | p. 227 |
| Chemical Mapping of Weathering Stages in Laterites | p. 237 |
| Electron Microprobe Determination of Minor and Trace Concentrations of Gold and Platinum Group Elements in Sulphides and Sulpharsenides: Problems, Solutions, and Applications | p. 247 |
| Composition of 15-17th Century Archaeological Glass Vessels Excavated in Antwerp, Belgium | p. 253 |
| Potassium Migration in Silica Glass During Electron Beam Irradiation | p. 269 |
| X-Ray Microanalysis of Frozen-Hydrated Biological Bulk Samples | p. 273 |
| Environmental SEM and X-Ray Microanalysis of Biological Materials | p. 283 |
| Effects of Electron-Beam/Gas Interactions on X-Ray Microanalysis in the Variable Pressure SEM | p. 295 |
| The Analytical Signal in EPMA and the Influence of the Electric Field Created by the Primary Beam | p. 301 |
| Standardless Analysis | p. 307 |
| A New Technique for Standardless Analysis by EPMA-TWIX | p. 317 |
| Stopping Power Factor for Standardless QEPMA | p. 321 |
| On the Measurement of the Backscattering Coefficient for Low Energy Electrons | p. 325 |
| Monte Carlo Simulations of Edge Artefacts in MULSAM Images | p. 333 |
| Assessment of the Inelastic Scattering Model in Monte-Carlo Simulations | p. 341 |
| A Rapid Comparison of Matrix Corrections in AES and XPS by Means of Computer Programs | p. 351 |
| Fractals and BaTiO[subscript 3]-Ceramic Microstructure Analysis | p. 365 |
| Fragmentation of Sputtered Cluster Ions of Transition Metals: Distributions of Lifetimes and Internal Energies | p. 371 |
| Sputtering of Tantalum by Atomic and Molecular Gold Ions: Comparative Study of Yields and Kinetic Energy Distributions of Atomic and Cluster Ions | p. 379 |
| The Standards, Measurements and Testing Programme (SMT), the European Support to Standardisation, Measurements and Testing Projects | p. 387 |
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