| Preface to the Second Edition | p. ix |
| Preface to the Reissue of the Materials Characterization Series | p. x |
| Preface to Series | p. xi |
| Preface to the Reissue of Characterization of Tribological Materials | p. xii |
| Preface | p. xiii |
| Acronyms | p. xv |
| Contributors | p. xvii |
| Introduction | |
| The Role of Adhesion in Wear | |
| Introduction | p. 11 |
| Considerations for Experiments | p. 12 |
| Background | p. 12 |
| Macroscopic Experiments | p. 13 |
| Atomic Level Experiments | p. 15 |
| Microscopic Contacts | p. 17 |
| Theoretical Considerations at the Atomic Level | p. 17 |
| Background for Theory | p. 17 |
| Universal Binding Energy Relation | p. 19 |
| Semiempirical Methods | p. 21 |
| Conclusions | p. 24 |
| References | p. 24 |
| Friction | |
| Introduction | p. 27 |
| Sliding Friction | p. 28 |
| Basic Concepts | p. 28 |
| The Dual Nature of Frictional Process | p. 29 |
| Phenomenology of Friction Process | p. 30 |
| Real Area of Contact | p. 33 |
| Adhesion Component of Friction | p. 38 |
| The Interface Shear Stress | p. 40 |
| Deformation Component of Friction | p. 40 |
| Viscoelastic Component of Friction | p. 43 |
| Friction Under Boundary Lubrication Conditions | p. 45 |
| Phenomena Associated with Friction | p. 47 |
| Rolling Friction | p. 51 |
| Review of Rolling Friction Hypotheses | p. 51 |
| Free Rolling | p. 54 |
| Exceptional Friction Processes | p. 57 |
| Conclusions | p. 58 |
| References | p. 58 |
| Adhesive Wear | |
| Introduction | p. 61 |
| Surface Analysis | p. 65 |
| Auger Analysis of Worn Surfaces After "Unlubricated Wear" | p. 65 |
| In Situ Systems | p. 67 |
| Conclusions | p. 73 |
| References | p. 75 |
| Abrasive Wear | |
| Abrasive Asperities and Grooves | p. 77 |
| Yield Criterion of an Abrasive Asperity | p. 79 |
| Abrasive Wear Mode Diagram | p. 81 |
| Degree of Wear at One Abrasive Groove | p. 86 |
| Macroscopic Wear in Multiple Abrasive Sliding Contacts | p. 87 |
| References | p. 92 |
| Boundary Lubrication | |
| Introduction | p. 95 |
| Mechanical Effects in Lubrication | p. 96 |
| Adequacy of Hydrodynamic Fluid Films | p. 96 |
| Chemical Effects in Liquid Lubrication-Boundary Lubrication | p. 98 |
| Wear and Failure | p. 99 |
| Research in Boundary Lubrication | p. 100 |
| Laboratory Research | p. 101 |
| Composition of Films | p. 102 |
| Further Mechanical Effects of the Boundary Lubricant Layer | p. 104 |
| Surface Analysis of Boundary Lubricated Metals | p. 105 |
| Ellipsometry and Its Use in Measuring Film Thickness | p. 106 |
| References | p. 109 |
| Magnetic Recording Surfaces | |
| Introduction | p. 111 |
| Magnetic Storage Systems | p. 112 |
| Wear Mechanisms | p. 114 |
| Head-(Particulate) Tape Interface | p. 114 |
| Head-(Particulate) Rigid Disk Interface | p. 116 |
| Head-(Thin-Film) Rigid Disk Interface | p. 117 |
| Lubrication Mechanisms | p. 119 |
| Measurement of Localized Lubricant Film Thickness | p. 120 |
| Lubricant-Disk Surface Interactions | p. 124 |
| Lubricant Degradation | p. 126 |
| References | p. 128 |
| Surface Analysis of Precision Ball Bearings | |
| Introduction | p. 130 |
| Disassembly | p. 131 |
| Examination, Optical Microscopy, and Photography | p. 131 |
| Gas Analysis by Mass Spectrometry | p. 131 |
| Lubricant Analysis and Removal | p. 131 |
| Microexamination | p. 132 |
| Scanning Electron Microscopy | p. 132 |
| Profilometry | p. 135 |
| Surface Analysis | p. 136 |
| Auger Electron Spectroscopy | p. 136 |
| Photoelectron Spectroscopy | p. 137 |
| SIMS | p. 142 |
| Vibrational Spectroscopy | p. 142 |
| Future Directions | p. 142 |
| Acknowledgments | p. 143 |
| References | p. 144 |
| Atomic Force Microscope Nanofriction | |
| Introduction | p. 146 |
| Description | p. 146 |
| Friction Measurements | p. 148 |
| Uses | p. 148 |
| Kelvin Probe Application | p. 150 |
| References | p. 150 |
| Appendices: Technique Summaries | |
| Light Microscopy | p. 155 |
| Scanning Electron Microscopy (SEM) | p. 156 |
| In Situ Wear Device for the Scanning Electron Microscope | p. 157 |
| Scanning Tunneling Microscopy and Scanning Force Microscopy (STM and SFM) | p. 158 |
| Transmission Electron Microscopy (TEM) | p. 159 |
| Energy-Dispersive X-Ray Spectroscopy (EDS) | p. 160 |
| Scanning Transmission Electron Microscopy (STEM) | p. 161 |
| Electron Probe X-Ray Microanalysis (EPMA) | p. 162 |
| X-Ray Diffraction (XRD) | p. 163 |
| Low-Energy Electron Diffraction (LEED) | p. 164 |
| X-Ray Photoelectron Spectroscopy (XPS) | p. 165 |
| Auger Electron Spectroscopy (AES) | p. 166 |
| Fourier Transform Infrared Spectroscopy (FTIR) | p. 167 |
| Raman Spectroscopy | p. 168 |
| Rutherford Backscattering Spectrometry (RBS) | p. 169 |
| Static Secondary Ion Mass Spectrometry (Static SIMS) | p. 170 |
| Surface Roughness: Measurement, Formation by Sputtering, Impact on Depth Profiling | p. 171 |
| Index | p. 173 |
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