| Preface | p. v |
| Difficulties of Monitoring a Defect at Its Origin and Its Dataware Features | p. 1 |
| Features of Defect Origin and Difficulties of Its Monitoring | p. 1 |
| Reasons, Types, and Stages of Defect Origin Evolution in Technical Objects | p. 2 |
| Sensors and Features of Dataware for Monitoring a Defect at Its Origin | p. 6 |
| Models of Signals Obtained as Output of Sensors at the Initial Stage of a Defect's Origin | p. 10 |
| Difficulties of Monitoring a Defect at Its Origin by Traditional Technologies | p. 12 |
| Factors Influencing the Adequacy of Monitoring a Defect's Origin by Methods of Correlation Analysis | p. 14 |
| Factors Affecting the Adequacy of Monitoring a Defect's Origin by Methods of Spectral Analysis | p. 16 |
| Influence of Signal Filtration on the Results of Monitoring a Defect's Origin | p. 19 |
| Influences of Traditional Methods of Choosing the Sampling Step on the Adequacy of Monitoring a Defect's Origin | p. 21 |
| Position-Binary Technology of Monitoring Defect at Its Origin | p. 23 |
| Specific Properties of Periodic Effect Objects | p. 23 |
| Position-Binary Technology of Analyzing Noisy Signals Obtained as Outputs of Sensors of Technical Objects | p. 24 |
| Opportunities of Using Position-Binary Technology for Monitoring Technical Conditions of Industrial Objects | p. 28 |
| Position-Selective Adaptive Sampling of Noisy Signals | p. 32 |
| Position-Binary Detecting a Defect Origin by Using Noise as a Data Carrier | p. 37 |
| Technology of Digital Analysis of Noise as a Carrier of Information About the Beginning of a Defect's Origin | p. 43 |
| Features of Analyzing Noise as a Data Carrier | p. 43 |
| Problems of Monitoring a Defect's Origin by Considering Noise as a Data Carrier | p. 45 |
| Methods of Determining the Noise Variance for the Case of Absence of Correlation Between Legitimate Signal and Noise | p. 47 |
| Digital Technology of Analyzing Noise and Legitimate Signal in Case of Absence of Correlation | p. 52 |
| Digital Technology of Determining the Noise Variance in Case of Availability of Correlation Between Legitimate Signal and Noise | p. 58 |
| Digital Technology of Separating Noise Samples and Legitimate Signal, and Determining Estimates of Its Statistical Characteristics | p. 66 |
| Algorithms for Determining the Distribution Law of Noise and the Correlation Coefficient | p. 68 |
| Algorithm for Determining the Arithmetic Mean Relative Error of Samples of Noisy Signals Caused by Noise | p. 72 |
| Digital Technology for Determining Information Signs of Monitoring a Defect's Origin When the Classical Conditions Are Not Fulfilled | p. 74 |
| Digital Identification of a Defect's Origin by Considering Noise as a Data Carrier | p. 77 |
| Robust Correlation Monitoring of a Defect at Its Origin | p. 83 |
| Problem of Monitoring a Defect at Its Origin Using Technology of Correlation Analysis of Signal Received as the Output of Sensors | p. 83 |
| Necessity of Providing Robustness of Correlation Monitoring of a Defect at Its Origin | p. 84 |
| Robust Method of Improving Estimates of Auto-Correlation Functions in Monitoring a Defect's Origin | p. 88 |
| Robust Method of Improving Cross-Correlation Function Estimates | p. 94 |
| Technology of Determining the Value of Providing the Robustness of Estimates of Auto- and Cross-Correlation Functions | p. 100 |
| Robust Algorithms of Improving Estimates of Auto- and Cross-Correlation Functions | p. 107 |
| Spectral Monitoring of a Defect's Origin | p. 113 |
| Necessity of Providing Robustness During Spectral Monitoring of a Defect's Origin | p. 113 |
| Reasons the Difference Between Positive and Negative Errors Caused by Noises Appears When Spectral Analysis of Signals Obtained from the Sensors Is Used | p. 117 |
| Algorithms for Calculating Errors of Coefficients of Fourier Series of Signals Obtained from Sensors | p. 119 |
| Algorithms for Determining Robust Estimations of Fourier Series Coefficients in Spectral Monitoring of a Defect's Origin | p. 122 |
| Technology of Spectral Analysis of Noise in Monitoring a Defect's Origin | p. 124 |
| Algorithms of Determining Coefficients of Fourier Series of a Legitimate Signal in Using Spectral Monitoring of a Defect's Origin | p. 129 |
| The Digital Technology of Forecasting Failures by Considering Noise as a Data Carrier | p. 135 |
| The Problem of Digital Forecasting Failures by Considering Noise as a Data Carrier | p. 135 |
| Algorithms for Forecasting the Transition of an Object into the Failure State by Considering Noise as a Data Carrier | p. 137 |
| Positional-Binary Technology of Detecting Initial Stage of Change to the Technical State of Objects | p. 141 |
| Technology of Forecasting Failures by Considering Noise as a Data Carrier | p. 144 |
| Diagnosing and Forecasting the Change to the State of Sea Platforms | p. 148 |
| Telemetric Information System of Forecasting Accidents During Drilling by Considering Noise as a Data Carrier | p. 152 |
| Technology and System of Monitoring a Defect's Origin in the Most Vulnerable Modules of Objects of Thermoelectric Power Stations and Nuclear Power Plants | p. 157 |
| The Technology of Monitoring a Defect's Origin by Considering Noise as a Data Carrier | p. 163 |
| Specific Properties of the Technology of Monitoring a Defect's Origin by Considering Noise as a Data Carrier | p. 163 |
| Digital System of Monitoring a Defect's Origin by Considering Noise as a Data Carrier | p. 167 |
| Robust Information System for Forecasting Accidents on Compressor Stations of Main Gas-Oil Pipelines | p. 170 |
| Digital City System of Monitoring the Technical State of Socially Important Objects by Considering Noise as a Data Carrier | p. 175 |
| Digital Technology and the System of Receiving Seismic Information from Deep Beds of the Earth and Monitoring the Origin of Anomalous Seismic Processes by Considering Noise as a Data Carrier | p. 180 |
| The Technology of Monitoring the Origin of Vascular Pathology of the Human Organism | p. 189 |
| Correlation Indicators of a Defect's Origin | p. 192 |
| Technologies of Indication of a Defect's Origin by Considering Noise as a Data Carrier | p. 204 |
| Spectral Indicators of a Defect's Origin | p. 207 |
| Position-Binary Indicators of a Defect's Origin | p. 209 |
| Recommended Digital Technologies for Monitoring a Defect's Origin | p. 210 |
| References | p. 217 |
| Index | p. 221 |
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