In-situ Electron Microscopy

Applications in Physics, Chemistry and Materials Science

By: Gerhard Dehm (Editor), James M. Howe (Editor), Josef Zweck (Editor)

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Hardcover | 26 April 2012 | Edition Number 1

At a Glance

Hardcover
402 Pages

Dimensions(cm)
24.64 x 17.55 x 2.11

Hardcover

$367.75

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Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers
real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information
on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.

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