| Authors' Biographies | p. ix |
| Foreword | p. xv |
| Acknowledgments | p. xvii |
| Fabrication and Operation of GaAs MESFETs | p. 1 |
| Fabrication of GaAs MESFETs | p. 1 |
| Principles of operation of GaAs MESFETs | p. 9 |
| Low frequency characterization of MESFETs | p. 24 |
| References | p. 31 |
| GaAs MESFETs: S Parameter Measurements and their Use in Circuit Design | p. 33 |
| Introduction | p. 33 |
| Basic principles | p. 33 |
| S parameter measurements--general concepts | p. 47 |
| Measurement of the fixture S parameters | p. 55 |
| On-wafer S parameter measurements | p. 63 |
| Utilization of S parameters | p. 67 |
| Conclusion | p. 88 |
| Acknowledgments | p. 88 |
| References | p. 88 |
| Conversions between two-port parameters normalized to Z[superscript 0] | p. 91 |
| Self-calibration procedure: error term determination | p. 94 |
| Synthesis and Design of Small-signal and Low Noise GaAs MESFET Amplifiers | p. 101 |
| Introduction | p. 101 |
| Design considerations for small-signal MESFET amplifiers | p. 102 |
| Bandpass amplifiers using the reactive matching principle | p. 108 |
| Ultrabroadband matched amplifiers | p. 134 |
| Distributed amplifiers | p. 147 |
| Low noise MESFET amplifiers | p. 153 |
| Conclusions | p. 175 |
| Acknowledgments | p. 176 |
| References | p. 176 |
| Linear Simulation and Computer-aided Engineering | p. 183 |
| The computer-aided engineering approach | p. 183 |
| Modelling of circuit elements | p. 185 |
| Linear circuit analysis | p. 193 |
| Optimization | p. 201 |
| Statistical methods | p. 208 |
| Layout | p. 213 |
| Data management | p. 218 |
| Future developments | p. 222 |
| References | p. 224 |
| Nonlinear Analysis | p. 227 |
| Introduction | p. 227 |
| Volterra series | p. 228 |
| The describing-function method | p. 233 |
| Time-domain analysis | p. 236 |
| The harmonic balance method | p. 239 |
| Advantages and disadvantages of each method | p. 245 |
| GaAs MESFET models | p. 246 |
| Applications of the nonlinear MESFET model | p. 270 |
| References | p. 283 |
| Power GaAs MESFET Amplifiers | p. 287 |
| Introduction | p. 287 |
| Device considerations | p. 287 |
| Large-signal characterization and modelling | p. 296 |
| Power amplifier design | p. 314 |
| Acknowledgments | p. 342 |
| References | p. 342 |
| Oscillators | p. 345 |
| Introduction | p. 345 |
| Concept of negative resistance | p. 347 |
| Three-port S parameter characterization of transistors | p. 348 |
| Oscillation and stability conditions | p. 350 |
| Fixed-frequency oscillators | p. 355 |
| Wideband tunable oscillators | p. 382 |
| Oscillator measurements | p. 400 |
| Acknowledgments | p. 410 |
| References | p. 411 |
| Conversion of two-port S parameters to three-port S parameters | p. 414 |
| GaAs Digital Integrated Circuits | p. 417 |
| Introduction | p. 417 |
| Advantages and constraints of GaAs in integrated circuit implementations | p. 418 |
| GaAs MESFET characteristics | p. 424 |
| Main features of the principal GaAs logic families | p. 427 |
| GaAs digital integrated circuit design | p. 434 |
| Manufacture of GaAs digital integrated circuits | p. 438 |
| Examples of GaAs digital integrated circuits | p. 438 |
| GaAs analog integrated circuits | p. 457 |
| Tests of GaAs digital integrated circuits | p. 462 |
| Packaging of GaAs digital integrated circuits | p. 464 |
| References | p. 465 |
| Microwave Monolithic Integrated Circuits | p. 471 |
| Introduction | p. 471 |
| Technology | p. 473 |
| Monolithic circuit components | p. 477 |
| Amplifiers | p. 488 |
| Switching and control functions | p. 497 |
| Oscillators and frequency-processing functions | p. 516 |
| Multifunction MMICs | p. 539 |
| Future developments | p. 542 |
| References | p. 544 |
| An Aspect of GaAs MESFET Reliability: Surface-induced Degradation Mechanisms | p. 551 |
| Introduction | p. 551 |
| Power MESFETs | p. 552 |
| MESFETs developed for digital integrated circuits | p. 567 |
| Conclusion | p. 570 |
| References | p. 571 |
| Index | p. 573 |
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