Frontiers in Electronic Testing

1 Foundations of STIL.- 1.1 Introduction.- 1.2 Organization of this Book.- 1.3 History.- 1.4 Foundation Efforts.- 1.5 Scope of STIL and Follow-On Efforts.- 1.5.1 Negotiating the Scope Limits.- 1.5.2 Format or Language?.- 1.5.3 Compression and the Binary Format Discussion.- 1.5.4 Evolving Standards.- 1.6 Parallel Standards.- 2 STIL Test.- 2.1 Test Stresses.- 2.1.1 ASIC Test.- 2.1.2 Microprocessor Test.- 2.2 Test Strategies.- 2.2.1 Fault Models.- 2.2.2 Functional and Structural Testing.- 2.2.3 Single Stuck-At Fault Model.- 2.2.4 Bridging Faults Model.- 2.2.5 IDDqTesting.- 2.2.6 Delay Tests.- 2.2.7 Transition Fault Model.- 2.2.8 Path Delay Fault Model.- 2.2.9 Test Metrics.- 2.2.10 Fault Diagnosis.- 2.3 Test Behaviors.- 2.3.1 Signals.- 2.3.2 Stimulus and Response.- 2.3.3 Periodicity.- 2.3.4 Output Response Constraints.- 2.4 Test Induced Faults.- 2.4.1 Packaging Effects.- 2.4.2 Simultaneous Switching Outputs.- 2.4.3 Guardbanding.- 2.5 Other Applications of STIL.- 3 Signals.- 3.1 Signals.- 3.1.1 User Names Characteristics.- 3.1.2 Really Long User Names and Concatenation.- 3.1.3 Types of Signals.- 3.2 Signal Arrays.- 3.3 SignalGroups.- 3.3.1 SignalGroup Block Names.- 3.3.2 SignalGroup Evaluation and Name Resolution.- 3.3.3 Applications of SignalGroups.- 3.4 STIL Statement Constructs and Block Structure.- 3.4.1 Single Statements Construct.- 3.4.2 Block Statements Construct.- 3.4.3 Named Blocks.- 3.4.4 Reserving the Leading Keyword.- 3.5 Signals and SignalGroups Syntax.- 3.6 Signal and SignalGroup Attributes.- 3.7 The Test Attributes.- 3.7.1 Application of the Test Attributes.- 3.7.2 Propagation of the Test Attributes.- 3.7.3 Two Usage Models for the Test Attributes.- 3.8 WGL Signals.- 4 Timing.- 4.1 The Timing Block.- 4.2 Event Statements.- 4.2.1 States and Levels.- 4.2.2 ForceUnknown, 'N'.- 4.2.3 The Difference Between Compare and Expect States.- 4.2.4 The Relationship Between Drive and Compare States.- 4.3 Basic Time Expressions.- 4.4 Waveforms.- 4.4.1 Types of Waveforms.- 4.4.2 Waveform Styles.- 4.5 WaveformCharacters.- 4.6 Merging Common Waveforms.- 4.7 Event Ordering and Persistence.- 4.8 Maintaining Related Events.- 4.8.1 End-Strobe Relationships.- 4.8.2 Delayed Pulse or NRZ Waveforms.- 4.9 Special Events.- 4.9.1 Time-Zero Event.- 4.9.2 Tristate Events.- 4.10 The Rest of the Timing Block Syntax.- 4.10.1 Period Statement.- 4.10.2 Signal Reference Resolution in Timing.- 4.11 WGL Timing Constructs.- 5 Patterns.- 5.1 Fundamental Pattern Constructs.- 5.2 Statement Order Dependency.- 5.3 WaveformTable Reference Statement.- 5.4 Signal Assignment.- 5.4.1 Multiple Signal Assignment.- 5.4.2 Multiple Based Signal Assignment.- 5.4.3 Decimal Mapping.- 5.4.4 Default Attributes.- 5.4.5 WFC Expressions.- 5.4.6 Mixing Modifiers.- 5.5 Vectors.- 5.6 Conditions.- 5.7 Incremental Behavior.- 5.8 Loop Constructs.- 5.8.1 Loop Statement.- 5.8.2 MatchLoop.- 5.8.3 Other Loops.- 5.9 Labels.- 5.10 Stop and IDDQTestPoint.- 5.11 Breakpoint.- 5.12 WGL Pattern Constructs.- 6 Tying It All Together.- 6.1 Basic STIL Information Flow.- 6.2 The PatternBurst.- 6.2.1 Basic PatternBurst.- 6.2.2 Hierarchical PatternBursts.- 6.2.3 Environment/Context Statements in the PatternBurst.- 6.2.4 PatternBurst Organizations.- 6.3 The PatternExec.- 6.4 Additional STIL Constructs.- 6.4.1 STIL block.- 6.4.2 Header block.- 6.4.3 Annotations.- 6.4.4 Comments.- 6.5 STIL Block Order.- 6.6 WGL Constructs.- 7 Files and the Include Statement.- 7.1 Include Statement.- 7.1.1 Relative File Path Naming.- 7.1.2 Absolute File Path Naming.- 7.1.3 Using Logicals in the Path Name.- 7.2 The IfNeed Option.- 7.3 Additional File Constructs and Behaviors.- 8 Specifications.- 8.1 Device Operating Specifications.- 8.2 STIL Extensions to the Spec Variables.- 8.3 Spec and Category.- 8.4 Spec Variable Resolution.- 8.5 Based Expressions.- 8.6 Selector.- 8.7 Applying Spec Variables.- 8.8 More Spec Constructs.- 8.8.1 Explicit Spec Variable Type Referencing.- 8.8.2 The Spec Variable Meas Type.- 8.9 Relative Waveform Timing.- 8.10 Styles of Timing Representation.- 8.11 WGL Specification Constructs.- 9 Partitioning Timing.- 9.1 All-Waveforms-in-One-Table.- 9.2 One-Waveform-Per-Table.- 9.3 Happier Mediums.- 9.3.1 WaveformCharacter Conventions.- 9.3.2 Common Waveform Groups.- 9.4 Waveform Grouping/Merging.- 9.5 WGL Pattern Data and WaveformCharacters.- 10 Advanced Timing.- 10.1 Incremental Timing Definitions.- 10.1.1 Waveform Labels.- 10.1.2 Inherit Statements in the Timing Block.- 10.1.3 InheritWaveformTable timing_name.wft_name.- 10.1.4 InheritWaveform timing_name.wft_name.wave_label.- 10.1.5 InheritWaveform timing_name.wft_name.wave_label.wfc.- 10.1.6 Inherited Information Resolution.- 10.1.7 Inherited signal_reference Resolution.- 10.1.8 The Syntax Issue with Inherit Names and Concatenation.- 10.2 Inherit Strategies.- 10.2.1 InheritWaveformTable Examples.- 10.2.2 Inheriting Separated Time and State in Waveforms.- 10.3 SubWaveforms.- 10.4 Multiple Data Waveforms.- 11 Procedures and Macros.- 11.1 Structured Test Development.- 11.2 STIL Procedures.- 11.3 MacroDefs.- 11.4 Differences Between Procedures and Macros.- 11.5 Procedure and Macro Parameters.- 11.5.1 Single Parameter Application.- 11.5.2 Multiple Parameter Application.- 11.6 Calling Procedures and Macros.- 11.6.1 Parameter Passing By Name.- 11.6.2 Parameter Passing By Contents.- 11.6.3 Extra Parameters.- 11.6.4 Missing Parameters.- 11.7 Using Named Procedures/MacroDefs Blocks.- 11.8 WGL Procedures and Macros.- 12 STIL Scan.- 12.1 Scan Design.- 12.1.1 Scan Operation (Design).- 12.1.2 Scan Process (Test).- 12.1.3 Characteristics of a Scan Test.- 12.2 STIL Scan Constructs.- 12.2.1 The Shift Block.- 12.2.2 Scanln and ScanOut Attributes.- 12.2.3 ScanStructures Block.- 12.2.4 ScanStructures PatternBurst Statement.- 12.2.5 ScanChain Pattern Statement.- 12.3 Scan Data Alignment ("Scan Padding").- 12.4 More Considerations on Scan Constructs.- 12.4.1 Pre-shift and Post-Shift Scan Data Consumption.- 12.4.2 The STIL Shift Calculation.- 12.4.3 The STIL Scan Pad State.- 12.5 Scan Groups.- 12.6 An Example: Transition Testing.- 12.7 WGL Scan.- 13 STIL Levels.- 13.1 STIL Statement with Extensions.- 13.2 Static and Dynamic Levels.- 13.3 Static Levels.- 13.3.1 DCLevels Statements.- 13.3.2 States and Levels.- 13.3.3 Applying DCLevels in the Test.- 13.4 Inter-cycle Dynamic Levels.- 13.4.1 Interaction of DCLevels and DCSets in the PatteraExec.- 13.5 Intra-cycle Dynamic Levels.- 13.6 DCSequence.- 13.7 Inherit Constructs.- 13.8 STIL Blocks and Data.- 14 More Pattern Constructs.- 14.1 Event-based Pattern Data.- 15 User Extensions.- 15.1 UserKeywords statement.- 15.2 Ambiguous Scenarios.- 15.3 UserFunctions.- 16 Additional Test Considerations.- 16.1 The Concept of Test Constraints.- 17 Name Mapping.- 17.1 Signal Names.- Terminology.- STIL Syntax Summary.