Frontiers in Electronic Testing

By: Benoit Nadeau-Dostie (Editor)

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Hardcover | 30 September 1999

At a Glance

Hardcover
260 Pages

Dimensions(cm)
25.4 x 18.42 x 1.27

Hardcover

$249.00

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Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.

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You Can Find This Book In

Non-Fiction Science Physics Electricity Engineering & Technology Energy Technology & Engineering Electrical Engineering Computing & I.T.Computer Science Electronics & Communications Engineering Communications Engineering & Telecommunications Electronics Engineering

Electronic Devices & Materials Circuits & Components

Foreword
Preface
Technology Overview
Memory Test and Diagnosis
Logic Test and Diagnosis
Embedded Test Design Flow
Hierarchical Core Test
Test and Measurement for PLLs and ADCs
System Test and Diagnosis
System Reuse of Embedded Test
Glossary
Index
Table of Contents provided by Publisher. All Rights Reserved.

Frontiers in Electronic Testing

At a Glance

Hardcover

Shipping

How to return your order

Defective items

You Can Find This Book In

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